Inventor · disambiguated record
Shigeru Sugamori
Also filed as: SUGAMORI SHIGERU
24 granted patents·1 pending application·903 citations·filing 1979–2006
97Inventor score
Top patents by PatentIndex Score
25 records- 0197US4497056AIC TesterTAKEDA RIKEN IND CO LTD·Filed 1982·Granted Jan 29, 1985·125 cites·20 claims
- 0296US6331770B1Application specific event based semiconductor test systemADVANTEST CORP·Filed 2000·Granted Dec 18, 2001·90 cites·12 claims
- 0394US4414665ASemiconductor memory device test apparatusNIPPON TELEGRAPH & TELEPHONE·Filed 1980·Granted Nov 8, 1983·92 cites·14 claims
- 0493US6651204B1Modular architecture for memory testing on event based test systemADVANTEST CORP·Filed 2000·Granted Nov 18, 2003·64 cites·13 claims
- 0590US6377065B1Glitch detection for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Apr 23, 2002·50 cites·12 claims
- 0689US6567941B1Event based test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2000·Granted May 20, 2003·43 cites·7 claims
- 0786US6532561B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Mar 11, 2003·62 cites·12 claims
- 0886US6314034B1Application specific event based semiconductor memory test systemADVANTEST CORP·Filed 2000·Granted Nov 6, 2001·41 cites·14 claims
- 0985US6536006B1Event tester architecture for mixed signal testingADVANTEST CORP·Filed 1999·Granted Mar 18, 2003·58 cites·11 claims
- 1081US6629282B1Module based flexible semiconductor test systemADVANTEST CORP·Filed 1999·Granted Sep 30, 2003·59 cites·14 claims
- 1179US6678643B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·55 cites·8 claims
- 1279US6631340B2Application specific event based semiconductor memory test systemADVANTEST CORP·Filed 2001·Granted Oct 7, 2003·27 cites·14 claims
- 1379US6404218B1Multiple end of test signal for event based test systemADVANTEST CORP·Filed 2000·Granted Jun 11, 2002·24 cites·14 claims
- 1475US6578169B1Data failure memory compaction for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Jun 10, 2003·19 cites·9 claims
- 1572US7089135B2Event based IC test systemADVANTEST CORP·Filed 2002·Granted Aug 8, 2006·15 cites·17 claims
- 1671US7209849B1Test system, added apparatus, and test methodADVANTEST CORP·Filed 2006·Granted Apr 24, 2007·7 cites·11 claims
- 1766US6445208B1Power source current measurement unit for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Sep 3, 2002·9 cites·5 claims
- 1865US6545460B2Power source current measurement unit for semiconductor test systemADVANTEST CORP·Filed 2002·Granted Apr 8, 2003·8 cites·5 claims
- 1963US7596730B2Test method, test system and assist boardADVANTEST CORP·Filed 2006·Granted Sep 29, 2009·4 cites·22 claims
- 2060US6668331B1Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memoryADVANTEST CORP·Filed 2000·Granted Dec 23, 2003·11 cites·8 claims
- 2156US6185708B1Maintenance free test systemADVANTEST CORP·Filed 1998·Granted Feb 6, 2001·19 cites·7 claims
- 2241US6172544B1Timing signal generation circuit for semiconductor test systemADVANTEST CORP·Filed 1999·Granted Jan 9, 2001·9 cites·10 claims
- 2340US4310802ALogical waveform generatorNIPPON TELEGRAPH & TELEPHONE·Filed 1979·Granted Jan 12, 1982·6 cites·7 claims
- 2434US4270116AHigh speed data logical comparison deviceNIPPON TELEGRAPH & TELEPHONE·Filed 1979·Granted May 26, 1981·6 cites·9 claims
- 2534US2003110427A1Semiconductor test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →