Inventor · disambiguated record
Shinji Sugatani
Also filed as: SUGATANI SHINJI
20 granted patents·10 pending applications·156 citations·filing 1986–2025
94Inventor score
Top patents by PatentIndex Score
30 records- 0189US8495549B2Method for generating wiring pattern dataMARUYAMA TAKASHI·Filed 2012·Granted Jul 23, 2013·11 cites·10 claims
- 0279US10919105B2Three-dimensional laminating and shaping apparatus and laminating and shaping methodADVANTEST CORP·Filed 2018·Granted Feb 16, 2021·1 cites·14 claims
- 0378US9734988B2Exposure apparatus and exposure methodINTEL CORP·Filed 2015·Granted Aug 15, 2017·2 cites·12 claims
- 0477US7414278B2Semiconductor device with shallow trench isolation which controls mechanical stressesFUJITSU LTD·Filed 2004·Granted Aug 19, 2008·23 cites·4 claims
- 0576US6900088B2Semiconductor device and its manufacture methodFUJITSU LTD·Filed 2002·Granted May 31, 2005·24 cites·8 claims
- 0675US2025031455A1Three-dimensional device and manufacturing method thereofADVANTEST CORP·Filed 2024·Application pending·0 cites
- 0774US6800909B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2002·Granted Oct 5, 2004·16 cites·6 claims
- 0874US6649965B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2002·Granted Nov 18, 2003·20 cites·18 claims
- 0965US7109128B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2004·Granted Sep 19, 2006·9 cites·14 claims
- 1065US6639280B2Semiconductor device and semiconductor chip using SOI substrateFUJITSU LTD·Filed 2002·Granted Oct 28, 2003·12 cites·9 claims
- 1164US9478396B2Charged particle beam exposure apparatusADVANTEST CORP·Filed 2014·Granted Oct 25, 2016·1 cites·14 claims
- 1259US2021202477A1Three-dimensional device and manufacturing method thereofADVANTEST CORP·Filed 2020·Application pending·0 cites
- 1358US2024234308A9Semiconductor apparatus and method for manufacturing semiconductor apparatusADVANTEST CORP·Filed 2023·Application pending·0 cites
- 1458US2024290741A1Semiconductor apparatus and manufacturing methodADVANTEST CORP·Filed 2023·Application pending·0 cites
- 1558US2024186208A1Method, structure, and manufacturing method for expanding chip heat dissipation areaADVANTEST CORP·Filed 2023·Application pending·0 cites
- 1658US2024234352A9Stacked chip and fabrication method of stacked chipADVANTEST CORP·Filed 2023·Application pending·0 cites
- 1757US12476221B2Fabrication method of stacked device and stacked deviceADVANTEST CORP·Filed 2022·Granted Nov 18, 2025·0 cites·4 claims
- 1857US10256074B2Exposure apparatus and exposure methodINTEL CORP·Filed 2017·Granted Apr 9, 2019·0 cites·17 claims
- 1956US2009327164A1Load distributing method, computer product, and load distributing apparatusMICROELECTRONICS LTD·Filed 2009·Application pending·0 cites
- 2055US6690071B2Semiconductor device using junction leak currentFUJITSU LTD·Filed 2002·Granted Feb 10, 2004·9 cites·14 claims
- 2155US2025374667A1Semiconductor device and manufacturing method of semiconductor deviceINST OF SCIENCE TOKYO·Filed 2025·Application pending·0 cites
- 2253US11229971B2Three-dimensional laminating and shaping apparatus and laminating and shaping methodADVANTEST CORP·Filed 2018·Granted Jan 25, 2022·0 cites·9 claims
- 2351US4734887AErasable programmable read only memory (EPROM) device and a process to fabricate thereofFUJITSU LTD·Filed 1986·Granted Mar 29, 1988·14 cites·5 claims
- 2450US11458561B2Electron beam column for three-dimensional printing device, three-dimensional printing device, and three-dimensional printing methodADVANTEST CORP·Filed 2017·Granted Oct 4, 2022·0 cites·6 claims
- 2547US6991996B2Manufacturing method of semiconductor device and semiconductor chip using SOI substrate, facilitating cleavingFUJITSU LTD·Filed 2003·Granted Jan 31, 2006·3 cites·5 claims
- 2646US6277718B1Semiconductor device and method for fabricating the sameFUJITSU LTD·Filed 1998·Granted Aug 21, 2001·11 cites·16 claims
- 2744US2020061908A13d additive manufacturing device and additive manufacturing methodADVANTEST CORP·Filed 2017·Application pending·0 cites
- 2841US2012304134A1Exposure data generation methodSUGATANI SHINJI·Filed 2012·Application pending·0 cites
- 2940US10573491B2Device, manufacturing method, and exposure apparatusADVANTEST CORP·Filed 2016·Granted Feb 25, 2020·0 cites·18 claims
- 3037US9684245B2Exposure apparatusADVANTEST CORP·Filed 2015·Granted Jun 20, 2017·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →