Inventor · disambiguated record
Shingo Sumie
Also filed as: SUMIE SHINGO
6 granted patents·192 citations·filing 1992–2010
85Inventor score
Top patents by PatentIndex Score
6 records- 0181US5943437AMethod and apparatus for classifying a defect on a semiconductor waferKOBE STEEL LTD·Filed 1996·Granted Aug 24, 1999·82 cites·14 claims
- 0274US5619326AMethod of sample valuation based on the measurement of photothermal displacementKOBE STEEL LTD·Filed 1995·Granted Apr 8, 1997·43 cites·9 claims
- 0373US5298970ASample evaluating method by using thermal expansion displacementKOBE STEEL LTD·Filed 1992·Granted Mar 29, 1994·40 cites·6 claims
- 0449US5760597AMethod of and apparatus for measuring lifetime of carriers in semiconductor sampleKOBE STEEL LTD·Filed 1996·Granted Jun 2, 1998·17 cites·14 claims
- 0540US5790252AMethod of and apparatus for determining residual damage to wafer edgesSHINETSU HANDOTAI KK·Filed 1996·Granted Aug 4, 1998·10 cites·2 claims
- 0629US9279762B2Apparatus and method for measuring semiconductor carrier lifetimeHAYASHI KAZUSHI·Filed 2010·Granted Mar 8, 2016·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →