Inventor · disambiguated record
Shinichiro Takasu
Also filed as: TAKASU SHINICHIRO
6 granted patents·124 citations·filing 1979–1997
84Inventor score
Top patents by PatentIndex Score
6 records- 0177US4291990AApparatus for measuring the distribution of irregularities on a mirror surfaceVLSI TECHNOLOGY RES ASS·Filed 1979·Granted Sep 29, 1981·29 cites·14 claims
- 0276US4479297AMethod of fabricating three-dimensional semiconductor devices utilizing CeO2 and ion-implantation.TOKYO SHIBAURA ELECTRIC CO·Filed 1982·Granted Oct 30, 1984·42 cites·9 claims
- 0374US4378269AMethod of manufacturing a single crystal silicon rodVLSI TECHNOLOGY RES ASS·Filed 1981·Granted Mar 29, 1983·18 cites·2 claims
- 0460US4411013ASystem for transferring a fine pattern onto a targetTOKYO SHIBAURA ELECTRIC CO·Filed 1981·Granted Oct 18, 1983·23 cites·5 claims
- 0543US5287167AMethod for measuring interstitial oxygen concentrationTOSHIBA CERAMICS CO·Filed 1991·Granted Feb 15, 1994·10 cites·23 claims
- 0632US5808745AMethod for measuring a substitutional carbon concentrationTOSHIBA CERAMICS CO·Filed 1997·Granted Sep 15, 1998·2 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →