Inventor · disambiguated record
Shuichi Tsukada
Also filed as: TSUKADA SHUICHI
55 granted patents·9 pending applications·294 citations·filing 1985–2025
98Inventor score
Files withMICRON TECHNOLOGY INC24ELPIDA MEMORY INC15TSUKADA SHUICHI9YOKOHAMA RUBBER CO LTD5PS4 LUXCO SARL3
Top patents by PatentIndex Score
64 records- 0195US8054679B2Phase change memory deviceELPIDA MEMORY INC·Filed 2008·Granted Nov 8, 2011·45 cites·14 claims
- 0291US10211832B1Input buffer circuitMICRON TECHNOLOGY INC·Filed 2017·Granted Feb 19, 2019·9 cites·22 claims
- 0388US11132015B2Powering clock tree circuitry using internal voltagesMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 28, 2021·6 cites·16 claims
- 0488US10878858B2Apparatuses including input buffers and methods for operating input buffersMICRON TECHNOLOGY INC·Filed 2019·Granted Dec 29, 2020·5 cites·18 claims
- 0588US9911471B1Input buffer circuitMICRON TECHNOLOGY INC·Filed 2017·Granted Mar 6, 2018·6 cites·14 claims
- 0688US7267551B2Inspection contact structure and probe cardTOKYO ELECTRON LTD·Filed 2005·Granted Sep 11, 2007·11 cites·8 claims
- 0787US10204666B2Input buffer circuitMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 12, 2019·5 cites·15 claims
- 0884US8503253B2Supply voltage generating circuit and semiconductor device having the sameELPIDA MEMORY INC·Filed 2012·Granted Aug 6, 2013·6 cites·21 claims
- 0983US10886898B1ZQ calibration using current sourceMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 5, 2021·4 cites·23 claims
- 1082US10199081B1Apparatuses and methods for providing bias signals in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2017·Granted Feb 5, 2019·5 cites·8 claims
- 1182US7224186B2Semiconductor circuit deviceELPIDA MEMORY INC·Filed 2005·Granted May 29, 2007·12 cites·15 claims
- 1280US7719296B2Inspection contact structure and probe cardTOKYO ELECTRON LTD·Filed 2007·Granted May 18, 2010·5 cites·6 claims
- 1379US7106641B2Dynamic semiconductor memory deviceELPIDA MEMORY INC·Filed 2005·Granted Sep 12, 2006·12 cites·21 claims
- 1477US8462538B2Semiconductor device having its standby current reducedTSUKADA SHUICHI·Filed 2011·Granted Jun 11, 2013·6 cites·22 claims
- 1576US10339988B2Input buffer circuitMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 2, 2019·2 cites·16 claims
- 1676US8305799B2Supply voltage generating circuit and semiconductor device having sameTSUKADA SHUICHI·Filed 2010·Granted Nov 6, 2012·4 cites·8 claims
- 1775US8879312B2Supply voltage generating circuit and semiconductor device having the sameTSUKADA SHUICHI·Filed 2014·Granted Nov 4, 2014·3 cites·5 claims
- 1875US8711611B2Supply voltage generating circuit and semiconductor device having the sameELPIDA MEMORY INC·Filed 2013·Granted Apr 29, 2014·3 cites·10 claims
- 1975US7450458B2Dynamic random access memories and method for testing performance of the sameHITACHI LTD·Filed 2006·Granted Nov 11, 2008·10 cites·15 claims
- 2074US5152852APneumatic tire having an asymmetric tread with a subgroove apex offset from the tread centerYOKOHAMA RUBBER CO LTD·Filed 1991·Granted Oct 6, 1992·35 cites·3 claims
- 2173US8310865B2Semiconductor memory device having diode cell structureTSUKADA SHUICHI·Filed 2010·Granted Nov 13, 2012·4 cites·14 claims
- 2271US8223536B2Semiconductor memory deviceTONOMURA YASUKO·Filed 2010·Granted Jul 17, 2012·5 cites·7 claims
- 2371US6975546B2Signal line driver circuit which reduces power consumption and enables high-speed data transferELPIDA MEMORY INC·Filed 2004·Granted Dec 13, 2005·2 cites·17 claims
- 2470US10902892B2Input buffer circuit having differential amplifierMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 26, 2021·2 cites·20 claims
- 2570US8139404B2Semiconductor memory deviceTSUKADA SHUICHI·Filed 2010·Granted Mar 20, 2012·4 cites·18 claims
- 2670US7633820B2Current limit circuit and semiconductor memory deviceELPIDA MEMORY INC·Filed 2006·Granted Dec 15, 2009·6 cites·13 claims
- 2770US7362636B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2006·Granted Apr 22, 2008·7 cites·6 claims
- 2870US7349275B2Semiconductor memoryELPIDA MEMORY INC·Filed 2006·Granted Mar 25, 2008·6 cites·18 claims
- 2968US11709523B2Powering clock tree circuitry using internal voltagesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·0 cites·20 claims
- 3068US11705888B2ZQ calibration using current sourceMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 18, 2023·0 cites·18 claims
- 3167US4657058APneumatic tireYOKOHAMA RUBBER CO LTD·Filed 1985·Granted Apr 14, 1987·20 cites·3 claims
- 3267US2025182819A1Apparatuses including output drivers and methods for providing output data signalsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3363US11176973B2Apparatuses including input buffers and methods for operating input buffersMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 16, 2021·0 cites·20 claims
- 3459US10373655B2Apparatuses and methods for providing bias signals according to operation modes as supply voltages vary in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 6, 2019·1 cites·20 claims
- 3558US12237001B2Apparatuses including output drivers and methods for providing output data signalsMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 25, 2025·0 cites·22 claims
- 3655US12283342B2Apparatuses and methods for input buffer data feedback equalization circuitsMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 22, 2025·0 cites·18 claims
- 3755US10529392B2Input buffer circuitMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 7, 2020·0 cites·20 claims
- 3855US8354877B2Current limit circuit and semiconductor memory deviceELPIDA MEMORY INC·Filed 2009·Granted Jan 15, 2013·2 cites·13 claims
- 3955US7701234B2Inspection contact structure and probe cardTOKYO ELECTRON LTD·Filed 2007·Granted Apr 20, 2010·0 cites·6 claims
- 4054US2025118356A1Apparatus including clock input bufferMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4153US7486579B2Method for controlling a semiconductor apparatusELPIDA MEMORY INC·Filed 2008·Granted Feb 3, 2009·2 cites·2 claims
- 4251US11057038B2Semiconductor device including buffer circuitMICRON TECHNOLOGY INC·Filed 2019·Granted Jul 6, 2021·0 cites·16 claims
- 4351US4903681AMethod and apparatus for cutting a cylindrical materialTOKYO SEIMITSU CO LTD·Filed 1988·Granted Feb 27, 1990·12 cites·13 claims
- 4450US11349479B2Input buffer circuitMICRON TECHNOLOGY INC·Filed 2019·Granted May 31, 2022·0 cites·15 claims
- 4550US8389969B2Semiconductor memory using IGBT, insulated gate bipolar transistor, as selective elementTSUKADA SHUICHI·Filed 2011·Granted Mar 5, 2013·0 cites·22 claims
- 4650US8094483B2Semiconductor device including bit line groupsNAKAI KIYOSHI·Filed 2009·Granted Jan 10, 2012·2 cites·17 claims
- 4747US10985753B2Apparatuses and methods for providing bias signals in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2018·Granted Apr 20, 2021·0 cites·23 claims
- 4847USRE45861ESemiconductor memory using field-effect transistor as selective elementPS4 LUXCO SARL·Filed 2015·Granted Jan 19, 2016·0 cites·30 claims
- 4947US4602666APneumatic radial tire for passenger vehiclesYOKOHAMA RUBBER CO LTD·Filed 1985·Granted Jul 29, 1986·10 cites·14 claims
- 5046USRE45753ESemiconductor device including bit line groupsPS4 LUXCO SARL·Filed 2014·Granted Oct 13, 2015·0 cites·37 claims
Showing the top 50 of 64 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →