Inventor · disambiguated record
Shiv Kumar Vats
Also filed as: VATS SHIV KUMAR
6 granted patents·19 citations·filing 2019–2023
75Inventor score
Files withST MICROELECTRONICS INT NV6
Top patents by PatentIndex Score
6 records- 0193US11714131B1Circuit and method for scan testingST MICROELECTRONICS INT NV·Filed 2022·Granted Aug 1, 2023·7 cites·20 claims
- 0289US11726140B2Scan circuit and methodST MICROELECTRONICS INT NV·Filed 2021·Granted Aug 15, 2023·2 cites·21 claims
- 0382US10802077B1Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modesST MICROELECTRONICS INT NV·Filed 2019·Granted Oct 13, 2020·10 cites·15 claims
- 0470US12360161B2Scan circuit and methodST MICROELECTRONICS INT NV·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 0567US12366605B2Area, cost, and time-effective scan coverage improvementST MICROELECTRONICS INT NV·Filed 2023·Granted Jul 22, 2025·0 cites·20 claims
- 0665US12345764B2Test pattern generation using multiple scan enablesST MICROELECTRONICS INT NV·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →