Inventor · disambiguated record
Shinjiro Watanabe
Also filed as: WATANABE SHINJIRO
9 granted patents·6 pending applications·13 citations·filing 2005–2023
80Inventor score
Top patents by PatentIndex Score
15 records- 0180US9296010B2Coating film forming apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Mar 29, 2016·6 cites·5 claims
- 0276US11340259B2Probe card management system and probe card management methodTOKYO ELECTRON LTD·Filed 2019·Granted May 24, 2022·1 cites·15 claims
- 0360US7221176B2Vacuum prober and vacuum probe methodTOKYO ELECTRON LTD·Filed 2005·Granted May 22, 2007·4 cites·12 claims
- 0460US2023314362A1Inspection apparatus and inspection methodTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0554US12372573B2Method for setting up test apparatus and test apparatusTOKYO ELECTRON LTD·Filed 2022·Granted Jul 29, 2025·0 cites·7 claims
- 0654US8105452B2Bonding apparatus and bonding methodWATANABE SHINJIRO·Filed 2011·Granted Jan 31, 2012·1 cites·1 claims
- 0752US12253559B2Alignment method and inspection apparatusTOKYO ELECTRON LTD·Filed 2022·Granted Mar 18, 2025·0 cites·7 claims
- 0850US11715657B2Substrate misalignment detection method, substrate position abnormality determination method, substrate transfer control method, and substrate misalignment detection deviceTOKYO ELECTRON LTD·Filed 2021·Granted Aug 1, 2023·0 cites·18 claims
- 0948US7896052B2Bonding apparatus and bonding methodTOKYO ELECTRON LTD·Filed 2006·Granted Mar 1, 2011·1 cites·7 claims
- 1045US2024019483A1Testing device and method, and non-transitory computer-readable recording mediumTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1144US11499992B2Inspection systemTOKYO ELECTRON LTD·Filed 2019·Granted Nov 15, 2022·0 cites·6 claims
- 1243US2020242747A1Image recognition system and image recognition methodTOKYO ELECTRON LTD·Filed 2020·Application pending·0 cites
- 1340US2019187180A1ProberTOKYO ELECTRON LTD·Filed 2018·Application pending·0 cites
- 1440US2013181040A1Semiconductor device manufacturing system and semiconductor device manufacturing methodTOKYO ELECTRON LTD·Filed 2012·Application pending·0 cites
- 1540US2014239484A1Method for forming sintered silver coating film, baking apparatus, and semiconductor deviceTOKYO ELECTRON LTD·Filed 2014·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Shinjiro Watanabe files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →