Inventor · disambiguated record
Shoichi Yasukawa
Also filed as: YASUKAWA SHOICHI
6 granted patents·30 citations·filing 2004–2016
78Inventor score
Technology areasG01N
Top patents by PatentIndex Score
6 records- 0182US8953743B2X-ray stress measurement method and apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted Feb 10, 2015·5 cites·12 claims
- 0277US8855266B2X-ray stress measurement apparatusYASUKAWA SHOICHI·Filed 2012·Granted Oct 7, 2014·5 cites·12 claims
- 0376US7342995B2Apparatus for estimating specific polymer crystalRIGAKU DENKI CO LTD·Filed 2004·Granted Mar 11, 2008·16 cites·7 claims
- 0450US9347895B2X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control programRIGAKU DENKI CO LTD·Filed 2014·Granted May 24, 2016·0 cites·6 claims
- 0546US10401310B2X-ray stress analysis apparatus, method, and programRIGAKU DENKI CO LTD·Filed 2016·Granted Sep 3, 2019·0 cites·5 claims
- 0640USD750783SX-ray residual stress measuring instrumentRIGAKU DENKI CO LTD·Filed 2014·Granted Mar 1, 2016·4 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →