USD750783SActiveUtility

X-ray residual stress measuring instrument

40
Assignee: RIGAKU DENKI CO LTDPriority: Feb 19, 2014Filed: Jul 16, 2014Granted: Mar 1, 2016
Est. expiryFeb 19, 2034(~7.6 yrs left)· nominal 20-yr term from priority
Inventors:Shoichi YasukawaSuguru Sasaki
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PatentIndex Score
4
Cited by
8
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a X-ray residual stress measuring instrument, as shown and described.

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