Inventor · disambiguated record
Shayan Zhang
Also filed as: ZHANG SHAYAN
49 granted patents·2 pending applications·524 citations·filing 2005–2016
98Inventor score
Files withFREESCALE SEMICONDUCTOR INC23ZHANG SHAYAN6RUSSELL ANDREW C3HUNTER BRADFORD L2RAMARAJU RAVINDRARAJ2
Top patents by PatentIndex Score
51 records- 0196US8284593B2Multi-port memory having a variable number of used write portsRUSSELL ANDREW C·Filed 2010·Granted Oct 9, 2012·34 cites·19 claims
- 0296US8004907B2SRAM with read and write assistFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Aug 23, 2011·55 cites·20 claims
- 0396US7292495B1Integrated circuit having a memory with low voltage read/write operationFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Nov 6, 2007·45 cites·22 claims
- 0494US7903483B2Integrated circuit having memory with configurable read/write operations and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Mar 8, 2011·32 cites·20 claims
- 0591US7523373B2Minimum memory operating voltage techniqueFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Apr 21, 2009·25 cites·16 claims
- 0691US7158432B1Memory with robust data sensing and method for sensing dataFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Jan 2, 2007·27 cites·20 claims
- 0790US9189053B2Performance based power management of a memory and a data storage system using the memoryFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Nov 17, 2015·29 cites·17 claims
- 0890US7542369B2Integrated circuit having a memory with low voltage read/write operationFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jun 2, 2009·20 cites·17 claims
- 0989US9817601B1Method and apparatus for determining feasibility of memory operating condition change using different back bias voltagesFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Nov 14, 2017·11 cites·20 claims
- 1088US8880965B2Low power scan flip-flop cellZHANG WANGGEN·Filed 2012·Granted Nov 4, 2014·14 cites·16 claims
- 1188US7671629B2Single-supply, single-ended level conversion circuit for an integrated circuit having multiple power supply domainsFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Mar 2, 2010·17 cites·16 claims
- 1286US8315117B2Integrated circuit memory having assisted access and method thereforZHANG SHAYAN·Filed 2009·Granted Nov 20, 2012·19 cites·19 claims
- 1385US8634263B2Integrated circuit having memory repair information storage and method thereforKENKARE PRASHANT U·Filed 2009·Granted Jan 21, 2014·17 cites·17 claims
- 1485US8059482B2Memory using multiple supply voltagesRUSSELL ANDREW C·Filed 2009·Granted Nov 15, 2011·16 cites·20 claims
- 1585US7852692B2Memory operation testingFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Dec 14, 2010·17 cites·20 claims
- 1685US7793172B2Controlled reliability in an integrated circuitFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Sep 7, 2010·17 cites·20 claims
- 1782US8156357B2Voltage-based memory size scaling in a data processing systemZHANG SHAYAN·Filed 2009·Granted Apr 10, 2012·12 cites·20 claims
- 1881US8077533B2Memory and method for sensing data in a memory using complementary sensing schemeHUNTER BRADFORD L·Filed 2006·Granted Dec 13, 2011·12 cites·20 claims
- 1979US8531899B2Methods for testing a memory embedded in an integrated circuitZHANG SHAYAN·Filed 2012·Granted Sep 10, 2013·6 cites·11 claims
- 2078US8935584B2System and method for performing scan testWAN GUOPING·Filed 2012·Granted Jan 13, 2015·7 cites·17 claims
- 2178US8379466B2Integrated circuit having an embedded memory and method for testing the memoryFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Feb 19, 2013·10 cites·12 claims
- 2278US7863963B2Level shifter for change of both high and low voltageFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Jan 4, 2011·9 cites·19 claims
- 2377US7800974B2Adjustable pipeline in a memory circuitFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Sep 21, 2010·8 cites·24 claims
- 2476US9110133B2Reconfigurable circuit and decoder thereforWANG LING·Filed 2014·Granted Aug 18, 2015·4 cites·20 claims
- 2576US7684264B2Memory system with RAM array and redundant RAM memory cells having a different designed cell circuit topology than cells of non redundant RAM arrayFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Mar 23, 2010·10 cites·20 claims
- 2674US9967094B2Data processing system with secure key generationFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted May 8, 2018·2 cites·20 claims
- 2774US8537625B2Memory voltage regulator with leakage current voltage controlRAMARAJU RAVINDRARAJ·Filed 2011·Granted Sep 17, 2013·5 cites·21 claims
- 2873US8736302B2Reconfigurable integrated circuitZHANG XU·Filed 2012·Granted May 27, 2014·4 cites·18 claims
- 2972US9263152B1Address fault detection circuitHOEFLER ALEXANDER B·Filed 2014·Granted Feb 16, 2016·4 cites·21 claims
- 3070US9429630B2Circuit for testing power supplies in multiple power modesFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Aug 30, 2016·2 cites·10 claims
- 3170US8587356B2Recoverable and reconfigurable pipeline structure for state-retention power gatingZHANG SHAYAN·Filed 2012·Granted Nov 19, 2013·3 cites·19 claims
- 3267US9726724B2On-chip current test circuitXU XIUQIANG·Filed 2014·Granted Aug 8, 2017·2 cites·19 claims
- 3367US7688656B2Integrated circuit memory having dynamically adjustable read margin and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Mar 30, 2010·6 cites·21 claims
- 3467US7675806B2Low voltage memory device and method thereofFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Mar 9, 2010·7 cites·18 claims
- 3564US8009489B2Memory with read cycle write backFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Aug 30, 2011·6 cites·28 claims
- 3663US9612653B2Integrated circuit with selectable power-on reset modeFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Apr 4, 2017·1 cites·11 claims
- 3758US8578384B2Method and apparatus for activating system componentsZHANG SHAYAN·Filed 2009·Granted Nov 5, 2013·1 cites·9 claims
- 3857US8904333B2Mixed signal IP core prototyping systemBAI HAIFENG·Filed 2013·Granted Dec 2, 2014·2 cites·15 claims
- 3955US8736301B2System on chip and control module thereforXIE MINGQIN·Filed 2012·Granted May 27, 2014·2 cites·18 claims
- 4053US9106089B2Self-adapting voltage amplifier and battery charger detectionZHANG WENZHONG·Filed 2013·Granted Aug 11, 2015·1 cites·19 claims
- 4152US8643426B2Voltage level shifterZHANG WENZHONG·Filed 2012·Granted Feb 4, 2014·1 cites·17 claims
- 4251US9007112B2Low power SRPG cellSHEN BAIQUAN·Filed 2014·Granted Apr 14, 2015·2 cites·15 claims
- 4348US8566620B2Data processing having multiple low power modes and method thereforRUSSELL ANDREW C·Filed 2010·Granted Oct 22, 2013·0 cites·20 claims
- 4448US2014284092A1Split pad for circuit boardBAI JING·Filed 2014·Application pending·0 cites
- 4541US8456935B2Memory and method for sensing data in a memory using complementary sensing schemeHUNTER BRADFORD L·Filed 2011·Granted Jun 4, 2013·0 cites·20 claims
- 4640US10453544B2Memory array with read only cells having multiple states and method of programming thereofFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Oct 22, 2019·0 cites·17 claims
- 4740US8941427B2Configurable flip-flopZHANG SHAYAN·Filed 2011·Granted Jan 27, 2015·0 cites·13 claims
- 4838US9691495B2Memory array with RAM and embedded ROMFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Jun 27, 2017·0 cites·20 claims
- 4937US8710916B2Electronic circuit having shared leakage current reduction circuitsRAMARAJU RAVINDRARAJ·Filed 2011·Granted Apr 29, 2014·0 cites·23 claims
- 5036US2015084680A1State retention power gated cell for integrated circuitCHENG ZHIHONG·Filed 2014·Application pending·0 cites
Showing the top 50 of 51 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Shayan Zhang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →