Inventor · disambiguated record
Sidharth Bhatia
Also filed as: BHATIA SIDHARTH
26 granted patents·12 pending applications·503 citations·filing 2007–2025
93Inventor score
Top patents by PatentIndex Score
38 records- 0196US8664127B2Two silicon-containing precursors for gapfill enhancing dielectric linerBHATIA SIDHARTH·Filed 2011·Granted Mar 4, 2014·480 cites·19 claims
- 0290US11853042B2Part, sensor, and metrology data integrationAPPLIED MATERIALS INC·Filed 2021·Granted Dec 26, 2023·2 cites·17 claims
- 0383US11592812B2Sensor metrology data integrationAPPLIED MATERIALS INC·Filed 2020·Granted Feb 28, 2023·2 cites·20 claims
- 0483US11328964B2Prescriptive analytics in highly collinear response spaceAPPLIED MATERIALS INC·Filed 2019·Granted May 10, 2022·2 cites·20 claims
- 0581US2024395505A1Smart dynamic load simulator for rf power delivery control systemAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0680US10748797B2Plasma parameters and skew characterization by high speed imagingAPPLIED MATERIALS INC·Filed 2018·Granted Aug 18, 2020·2 cites·10 claims
- 0779US8716154B2Reduced pattern loading using silicon oxide multi-layersBHATIA SIDHARTH·Filed 2011·Granted May 6, 2014·5 cites·19 claims
- 0879US2025271847A1Data intergrationAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0978US2024355687A1Prescriptive analytics in highly collinear response spaceAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1077US12080519B2Smart dynamic load simulator for RF power delivery control systemAPPLIED MATERIALS INC·Filed 2022·Granted Sep 3, 2024·0 cites·18 claims
- 1176USD1045924SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2024·Granted Oct 8, 2024·4 cites·1 claims
- 1276USD1031743SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2022·Granted Jun 18, 2024·5 cites·1 claims
- 1375US12074073B2Prescriptive analytics in highly collinear response spaceAPPLIED MATERIALS INC·Filed 2022·Granted Aug 27, 2024·0 cites·17 claims
- 1475US2024061409A1Part, sensor, and metrology data integrationAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1574US12366853B2Sensor metrology data integrationAPPLIED MATERIALS INC·Filed 2023·Granted Jul 22, 2025·0 cites·20 claims
- 1672US2024046096A1Predictive modeling of a manufacturing process using a set of trained inverted modelsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1768US11495440B2Plasma density control on substrate edgeAPPLIED MATERIALS INC·Filed 2020·Granted Nov 8, 2022·0 cites·20 claims
- 1868US9589773B2In-situ etch rate determination for chamber clean endpointAPPLIED MATERIALS INC·Filed 2016·Granted Mar 7, 2017·1 cites·20 claims
- 1967US12504726B2Determining equipment constant updates by machine learningAPPLIED MATERIALS INC·Filed 2022·Granted Dec 23, 2025·0 cites·20 claims
- 2067US11545376B2Plasma parameters and skew characterization by high speed imagingAPPLIED MATERIALS INC·Filed 2020·Granted Jan 3, 2023·0 cites·20 claims
- 2164US12510878B2Physically-informed multi-system hardware operating windowsAPPLIED MATERIALS INC·Filed 2022·Granted Dec 30, 2025·0 cites·17 claims
- 2264US12498705B2Chamber matching by equipment constant updatesAPPLIED MATERIALS INC·Filed 2022·Granted Dec 16, 2025·0 cites·20 claims
- 2364US2025224721A1Causality-based fleet matchingAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 2463US11120976B2Apparatus and methods for removing contaminant particles in a plasma processAPPLIED MATERIALS INC·Filed 2020·Granted Sep 14, 2021·0 cites·20 claims
- 2560US11829873B2Predictive modeling of a manufacturing process using a set of trained inverted modelsAPPLIED MATERIALS INC·Filed 2020·Granted Nov 28, 2023·0 cites·18 claims
- 2659US10790121B2Plasma density control on substrate edgeAPPLIED MATERIALS INC·Filed 2018·Granted Sep 29, 2020·0 cites·20 claims
- 2759US2025060321A1Optical inspection of wafers in manufacturing systemsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2858US12469686B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·20 claims
- 2958US10714319B2Apparatus and methods for removing contaminant particles in a plasma processAPPLIED MATERIALS INC·Filed 2019·Granted Jul 14, 2020·0 cites·10 claims
- 3057US2025225410A1Causality-based fleet matchingAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 3155US12467136B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·19 claims
- 3253US2025028294A1Measurement of inherent substrate distortionAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 3346US11157661B2Process development visualization toolAPPLIED MATERIALS INC·Filed 2019·Granted Oct 26, 2021·0 cites·20 claims
- 3446US2008311754A1Low temperature sacvd processes for pattern loading applicationsAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
- 3545US2007212850A1Gap-fill depositions in the formation of silicon containing dielectric materialsAPPLIED MATERIALS INC·Filed 2007·Application pending·0 cites
- 3644USD1045923SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2024·Granted Oct 8, 2024·0 cites·1 claims
- 3740US2018294139A1Gas phase particle reduction in pecvd chamberAPPLIED MATERIALS INC·Filed 2018·Application pending·0 cites
- 3839US10755903B2RPS defect reduction by cyclic clean induced RPS coolingAPPLIED MATERIALS INC·Filed 2017·Granted Aug 25, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →