Inventor · disambiguated record
Siqing Nie
Also filed as: NIE SIQING
3 granted patents·2 citations·filing 2020–2023
50Inventor score
Technology areasG06T
Files withKLA CORP3
Top patents by PatentIndex Score
3 records- 0181US11494895B2Detecting defects in array regions on specimensKLA CORP·Filed 2020·Granted Nov 8, 2022·2 cites·20 claims
- 0259US12190500B2Detecting defects on specimensKLA CORP·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 0352US12165306B2Segmentation of design care areas with a rendered design imageKLA CORP·Filed 2021·Granted Dec 10, 2024·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →