Inventor · disambiguated record
Sietse Thijmen Van Der Post
Also filed as: VAN DER POST SIETSE THIJMEN
16 granted patents·1 pending application·21 citations·filing 2016–2023
88Inventor score
Files withASML NETHERLANDS BV17
Top patents by PatentIndex Score
17 records- 0189US10451559B2Illumination source for an inspection apparatus, inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2018·Granted Oct 22, 2019·3 cites·13 claims
- 0289US9851246B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2016·Granted Dec 26, 2017·4 cites·20 claims
- 0388US10330606B2Illumination source for an inspection apparatus, inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2017·Granted Jun 25, 2019·3 cites·12 claims
- 0483US10126659B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2016·Granted Nov 13, 2018·3 cites·20 claims
- 0581US10725381B2Optical systems, metrology apparatus and associated methodASML NETHERLANDS BV·Filed 2018·Granted Jul 28, 2020·3 cites·15 claims
- 0678US10488765B2Method of optimizing the position and/or size of a measurement illumination spot relative to a target on a substrate, and associated apparatusASML NETHERLANDS BV·Filed 2018·Granted Nov 26, 2019·2 cites·13 claims
- 0777US10613448B2Method and apparatus for determining alignment properties of a beam of radiationASML NETHERLANDS BV·Filed 2018·Granted Apr 7, 2020·1 cites·16 claims
- 0874US10248029B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2016·Granted Apr 2, 2019·1 cites·20 claims
- 0968US11626704B2Methods and apparatus for predicting performance of a measurement method, measurement method and apparatusASML NETHERLANDS BV·Filed 2018·Granted Apr 11, 2023·1 cites·21 claims
- 1064US10578979B2Method and apparatus for inspection and metrologyASML NETHERLANDS BV·Filed 2019·Granted Mar 3, 2020·0 cites·19 claims
- 1159US11815402B2Wavefront sensor and associated metrology apparatusASML NETHERLANDS BV·Filed 2019·Granted Nov 14, 2023·0 cites·15 claims
- 1254US12269229B2Reflector manufacturing method and associated reflectorASML NETHERLANDS BV·Filed 2020·Granted Apr 8, 2025·0 cites·14 claims
- 1352US2025341790A1A membrane and associated method and apparatusASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1451US12416870B2Measuring method and measuring apparatusASML NETHERLANDS BV·Filed 2020·Granted Sep 16, 2025·0 cites·15 claims
- 1549US10712673B2Method of determining a property of a structure, inspection apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Jul 14, 2020·0 cites·20 claims
- 1648US12164125B2Manufacturing a reflective diffraction gratingASML NETHERLANDS BV·Filed 2020·Granted Dec 10, 2024·0 cites·14 claims
- 1741US11243470B2Method and apparatus for deriving corrections, method and apparatus for determining a property of a structure, device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Feb 8, 2022·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →