Inventor · disambiguated record
Simon Hendrik Celine Van Gorp
Also filed as: VAN GORP SIMON HENDRIK CELINE
11 granted patents·1 pending application·6 citations·filing 2017–2023
82Inventor score
Files withASML NETHERLANDS BV12
Top patents by PatentIndex Score
12 records- 0191US11768442B2Method of determining control parameters of a device manufacturing processASML NETHERLANDS BV·Filed 2022·Granted Sep 26, 2023·1 cites·20 claims
- 0282US11513442B2Method of determining control parameters of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Nov 29, 2022·2 cites·20 claims
- 0380US12197136B2Method of determining control parameters of a device manufacturing processASML NETHERLANDS BV·Filed 2023·Granted Jan 14, 2025·0 cites·20 claims
- 0477US10649342B2Method and apparatus for determining a fingerprint of a performance parameterASML NETHERLANDS BV·Filed 2017·Granted May 12, 2020·2 cites·20 claims
- 0574US11086229B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Aug 10, 2021·1 cites·24 claims
- 0670US11714357B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 0762US11194258B2Method and apparatus for determining a fingerprint of a performance parameterASML NETHERLANDS BV·Filed 2020·Granted Dec 7, 2021·0 cites·20 claims
- 0861US12287582B2Method for controlling a lithographic apparatus and associated apparatusesASML NETHERLANDS BV·Filed 2020·Granted Apr 29, 2025·0 cites·20 claims
- 0954US2024061353A1Method for determining a focus actuation profile for one or more actuators of a lithographic exposure apparatusASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1049US11181829B2Method for determining a control parameter for an apparatus utilized in a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Nov 23, 2021·0 cites·20 claims
- 1147US12416868B2Non-correctable error in metrologyASML NETHERLANDS BV·Filed 2020·Granted Sep 16, 2025·0 cites·20 claims
- 1244US12169366B2Voltage contrast metrology markASML NETHERLANDS BV·Filed 2018·Granted Dec 17, 2024·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Simon Hendrik Celine Van Gorp files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →