Inventor · disambiguated record
Sriram Madhavan
Also filed as: MADHAVAN SRIRAM
13 granted patents·1 pending application·66 citations·filing 1998–2019
88Inventor score
Files withGLOBALFOUNDRIES INC5CUMMINS INC2ADVANCED MICRO DEVICES INC1CYPRESS SEMICONDUCTOR CORP1MADHAVAN SRIRAM1
Top patents by PatentIndex Score
14 records- 0190US8918745B2Stitch insertion for reducing color density differences in double patterning technology (DPT)WANG LYNN·Filed 2013·Granted Dec 23, 2014·9 cites·20 claims
- 0284US7804317B1Test device for determining charge damage to a transistorADVANCED MICRO DEVICES INC·Filed 2006·Granted Sep 28, 2010·11 cites·8 claims
- 0382US8516407B1Methods for quantitatively evaluating the quality of double patterning technology-compliant layoutsWANG LYNN T·Filed 2012·Granted Aug 20, 2013·9 cites·19 claims
- 0475US8293606B2Body tie test structure for accurate body effect measurementMADHAVAN SRIRAM·Filed 2010·Granted Oct 23, 2012·4 cites·17 claims
- 0568US7880229B2Body tie test structure for accurate body effect measurementGLOBALFOUNDRIES INC·Filed 2007·Granted Feb 1, 2011·2 cites·12 claims
- 0665US6534378B1Method for forming an integrated circuit deviceCYPRESS SEMICONDUCTOR CORP·Filed 1998·Granted Mar 18, 2003·31 cites·14 claims
- 0764US10968803B2Systems and methods for idle fuel economy modeCUMMINS INC·Filed 2019·Granted Apr 6, 2021·0 cites·20 claims
- 0855US10392990B2Systems and methods for idle fuel economy modeCUMMINS INC·Filed 2016·Granted Aug 27, 2019·0 cites·22 claims
- 0947US10372871B2IC layout post-decomposition mask allocation optimizationGLOBALFOUNDRIES INC·Filed 2017·Granted Aug 6, 2019·0 cites·20 claims
- 1046US2015286763A1Pattern matching for predicting defect limited yieldGLOBALFOUNDRIES INC·Filed 2014·Application pending·0 cites
- 1144US10055535B2Method, system and program product for identifying anomalies in integrated circuit design layoutsGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 21, 2018·0 cites·20 claims
- 1241US8745553B2Method and apparatus for applying post graphic data system stream enhancementsMUDDU SWAMY·Filed 2012·Granted Jun 3, 2014·0 cites·16 claims
- 1337US8656336B2Pattern based method for identifying design for manufacturing improvement in a semiconductor devicePATHAK PIYUSH·Filed 2012·Granted Feb 18, 2014·0 cites·22 claims
- 1433US10095826B2Feed-forward for silicon inspections (DFM2CFM : design to silicon) and feed-back for weakpoint predictor decks (CFM2DFM : silicon to design) guided by marker classification, sampling, and higher dimensional analysisGLOBALFOUNDRIES INC·Filed 2016·Granted Oct 9, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →