Inventor · disambiguated record
Srinivas Patil
Also filed as: PATIL SRINIVAS
13 granted patents·1 pending application·186 citations·filing 1996–2020
91Inventor score
Top patents by PatentIndex Score
14 records- 0186US11237587B1On-chip clock controller (OCC) manager based turbo capture clockingQUALCOMM INC·Filed 2020·Granted Feb 1, 2022·2 cites·30 claims
- 0286US6456961B1Method and apparatus for creating testable circuit designs having embedded coresFiled 1999·Granted Sep 24, 2002·66 cites·18 claims
- 0380US7155648B2Linear feedback shift register reseedingINTEL CORP·Filed 2003·Granted Dec 26, 2006·34 cites·30 claims
- 0478US8522189B2Functional fabric based test access mechanism for SoCsPATIL SRINIVAS·Filed 2011·Granted Aug 27, 2013·6 cites·11 claims
- 0576US10324131B1Laser-based integrated circuit testing techniquesQUALCOMM INC·Filed 2018·Granted Jun 18, 2019·2 cites·12 claims
- 0675US9043665B2Functional fabric based test wrapper for circuit testing of IP blocksPATIL SRINIVAS·Filed 2011·Granted May 26, 2015·4 cites·24 claims
- 0774US5870411AMethod and system for testing self-timed circuitryIBM·Filed 1996·Granted Feb 9, 1999·37 cites·6 claims
- 0872US7197721B2Weight compression/decompression systemINTEL CORP·Filed 2002·Granted Mar 27, 2007·16 cites·18 claims
- 0968US9087037B2Functional fabric based test access mechanism for SoCsINTEL CORP·Filed 2013·Granted Jul 21, 2015·2 cites·18 claims
- 1064US8793095B2Functional fabric-based test controller for functional and structural test and debugPATIL SRINIVAS·Filed 2011·Granted Jul 29, 2014·2 cites·20 claims
- 1151US7861116B2Device, system, and method for optimized concurrent error detectionINTEL CORP·Filed 2007·Granted Dec 28, 2010·1 cites·13 claims
- 1248US7216274B2Flexible scan architectureINTEL CORP·Filed 2003·Granted May 8, 2007·3 cites·38 claims
- 1345US5912900AMethod and system for testing self-timed circuitryIBM·Filed 1996·Granted Jun 15, 1999·11 cites·8 claims
- 1436US2007168767A1Flexible scan architectureJABER TALAL K·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →