Inventor · disambiguated record
Ssu-I Fu
Also filed as: FU SSU-I
115 granted patents·33 pending applications·515 citations·filing 2010–2025
99Inventor score
Top patents by PatentIndex Score
148 records- 0198US11901239B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Feb 13, 2024·2 cites·12 claims
- 0298US11062954B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jul 13, 2021·11 cites·5 claims
- 0398US9735047B1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 15, 2017·30 cites·10 claims
- 0498US9349833B1Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 24, 2016·32 cites·11 claims
- 0597US11721591B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Aug 8, 2023·3 cites·5 claims
- 0697US9123659B1Method for manufacturing finFET deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 1, 2015·30 cites·12 claims
- 0796US10985264B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 20, 2021·9 cites·9 claims
- 0896US10607882B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Mar 31, 2020·12 cites·9 claims
- 0996US10249488B1Semiconductor devices with same conductive type but different threshold voltages and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 2, 2019·12 cites·7 claims
- 1096US9379119B1Static random access memoryUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 28, 2016·15 cites·18 claims
- 1196US8470714B1Method of forming fin structures in integrated circuitsTSAI SHIH-HUNG·Filed 2012·Granted Jun 25, 2013·44 cites·10 claims
- 1295US12068309B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Aug 20, 2024·2 cites·17 claims
- 1395US9287263B1Semiconductor device having a metal gateUNITED MICROELECTRONICS CORP·Filed 2014·Granted Mar 15, 2016·17 cites·10 claims
- 1495US9166024B2FinFET structure with cavities and semiconductor compound portions extending laterally over sidewall spacersUNITED MICROELECTRONICS CORP·Filed 2013·Granted Oct 20, 2015·23 cites·2 claims
- 1595US9142641B1Method for manufacturing finFETUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 22, 2015·21 cites·10 claims
- 1695US8664060B2Semiconductor structure and method of fabricating the sameLIU AN-CHI·Filed 2012·Granted Mar 4, 2014·22 cites·20 claims
- 1794US9905464B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Feb 27, 2018·9 cites·5 claims
- 1894US8669618B2Manufacturing method for semiconductor device having metal gateFU SSU-I·Filed 2011·Granted Mar 11, 2014·20 cites·7 claims
- 1993US8278184B1Fabrication method of a non-planar transistorCHEN YING-TSUNG·Filed 2011·Granted Oct 2, 2012·24 cites·10 claims
- 2092US10395991B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 27, 2019·7 cites·20 claims
- 2192US9589966B2Static random access memoryUNITED MICROELECTRONICS CORP·Filed 2015·Granted Mar 7, 2017·9 cites·17 claims
- 2292US8895396B1Epitaxial Process of forming stress inducing epitaxial layers in source and drain regions of PMOS and NMOS structuresUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 25, 2014·14 cites·18 claims
- 2391US9455194B1Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 27, 2016·7 cites·6 claims
- 2491US2025113589A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2590US11495681B2Semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2020·Granted Nov 8, 2022·2 cites·16 claims
- 2690US10971397B2Semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 6, 2021·5 cites·19 claims
- 2790US2024379451A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2889US9793380B2Semiconductor structure and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 17, 2017·5 cites·10 claims
- 2989US9627268B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Apr 18, 2017·5 cites·5 claims
- 3089US2024371703A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 3188US12328922B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Granted Jun 10, 2025·0 cites·9 claims
- 3288US12261086B2Method for integrating high-voltage (HV) device, medium-voltage (MV) device, and low-voltage (LV) deviceUNITED MICROELECTRONICS CORP·Filed 2022·Granted Mar 25, 2025·1 cites·7 claims
- 3388US12211751B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jan 28, 2025·0 cites·12 claims
- 3488US11710778B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Jul 25, 2023·1 cites·10 claims
- 3588US10546922B2Method for fabricating cap layer on an epitaxial layerUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 28, 2020·4 cites·13 claims
- 3688US9916978B2Method for fabricating a Fin field effect transistor (FinFET)UNITED MICROELECTRONICS CORP·Filed 2016·Granted Mar 13, 2018·5 cites·21 claims
- 3788US9054187B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 9, 2015·8 cites·12 claims
- 3887US10008569B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 26, 2018·3 cites·9 claims
- 3987US8993384B2Semiconductor device and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 31, 2015·7 cites·9 claims
- 4087US8722501B2Method for manufacturing multi-gate transistor deviceTSAI SHIH-HUNG·Filed 2011·Granted May 13, 2014·8 cites·12 claims
- 4186US12074070B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Aug 27, 2024·0 cites·7 claims
- 4286US11152515B2Semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 19, 2021·3 cites·9 claims
- 4386US9786510B2Fin-shaped structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2014·Granted Oct 10, 2017·5 cites·6 claims
- 4486US9685385B1Method of fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 20, 2017·4 cites·18 claims
- 4586US8981487B2Fin-shaped field-effect transistor (FinFET)UNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 17, 2015·7 cites·8 claims
- 4686US2025275202A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 4785US12094783B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 17, 2024·0 cites·9 claims
- 4885US2024395909A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 4984US12094956B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 17, 2024·0 cites·8 claims
- 5084US9847398B1Semiconductor device with gate structure having dielectric layer on one side and contact plug on the other sideUNITED MICROELECTRONICS CORP·Filed 2016·Granted Dec 19, 2017·4 cites·9 claims
Showing the top 50 of 148 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →