Inventor · disambiguated record
Stephanie W. Butler
Also filed as: BUTLER STEPHANIE · BUTLER STEPHANIE W · BUTLER STEPHANIE WATTS
19 granted patents·3 pending applications·891 citations·filing 1993–2019
95Inventor score
Top patents by PatentIndex Score
22 records- 0194US5402367AApparatus and method for model based process controlTEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 28, 1995·164 cites·19 claims
- 0293US5864773AVirtual sensor based monitoring and fault detection/classification system and method for semiconductor processing equipmentTEXAS INSTRUMENTS INC·Filed 1996·Granted Jan 26, 1999·259 cites·18 claims
- 0391US5503707AMethod and apparatus for process endpoint prediction based on actual thickness measurementsTEXAS INSTRUMENTS INC·Filed 1993·Granted Apr 2, 1996·124 cites·24 claims
- 0485US5838595AApparatus and method for model based process controlTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 17, 1998·98 cites·20 claims
- 0584US10334995B1Decorative cover for a paper towel roll and holderBUTLER STEPHANIE·Filed 2017·Granted Jul 2, 2019·5 cites·19 claims
- 0683US9899332B2Visual identification of semiconductor diesTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 20, 2018·5 cites·20 claims
- 0781US6812073B2Source drain and extension dopant concentrationTEXAS INSTRUMENTS INC·Filed 2002·Granted Nov 2, 2004·26 cites·12 claims
- 0879US6787425B1Methods for fabricating transistor gate structuresTEXAS INSTRUMENTS INC·Filed 2003·Granted Sep 7, 2004·27 cites·15 claims
- 0979US5458732AMethod and system for identifying process conditionsTEXAS INSTRUMENTS INC·Filed 1994·Granted Oct 17, 1995·72 cites·34 claims
- 1079US5399229ASystem and method for monitoring and evaluating semiconductor wafer fabricationTEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 21, 1995·71 cites·23 claims
- 1178US6808997B2Complementary junction-narrowing implants for ultra-shallow junctionsTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 26, 2004·17 cites·10 claims
- 1275US8051398B2Test method and system for characterizing and/or refining an IC design cycleTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 1, 2011·7 cites·18 claims
- 1373US7704883B2Annealing to improve edge roughness in semiconductor technologyTEXAS INSTRUMENTS INC·Filed 2006·Granted Apr 27, 2010·4 cites·13 claims
- 1468US7531398B2Methods and devices employing metal layers in gates to introduce channel strainTEXAS INSTRUMENTS INC·Filed 2006·Granted May 12, 2009·4 cites·29 claims
- 1566US10431551B2Visual identification of semiconductor diesTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 1, 2019·1 cites·20 claims
- 1662US7345355B2Complementary junction-narrowing implants for ultra-shallow junctionsTEXAS INSTRUMENTS INC·Filed 2004·Granted Mar 18, 2008·6 cites·4 claims
- 1758US11051491B1Portable pet water dispensing systemBUTLER STEPHANIE·Filed 2019·Granted Jul 6, 2021·1 cites·18 claims
- 1842US7793186B1System and method for increasing the extent of built-in self-testing of memory and circuitryTEXAS INSTRUMENTS INC·Filed 2010·Granted Sep 7, 2010·0 cites·6 claims
- 1942US7752518B2System and method for increasing the extent of built-in self-testing of memory and circuitryTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 6, 2010·0 cites·14 claims
- 2038US2005189660A1Source drain and extension dopant concentrationFiled 2004·Application pending·0 cites
- 2138US2008251864A1Stacked poly structure to reduce the poly particle count in advanced cmos technologyCHEN YUANNING·Filed 2007·Application pending·0 cites
- 2235US2004067631A1Reduction of seed layer roughness for use in forming SiGe gate electrodeFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →