Inventor · disambiguated record
Steven K. Case
Also filed as: CASE STEVEN K · CASE STEVEN N
44 granted patents·19 pending applications·1,981 citations·filing 1980–2012
99Inventor score
Top patents by PatentIndex Score
63 records- 0197US4733969ALaser probe for determining distanceCYBEROPTICS CORP·Filed 1986·Granted Mar 29, 1988·275 cites·18 claims
- 0297US4547037AHolographic method for producing desired wavefront transformationsUNIV MINNESOTA·Filed 1980·Granted Oct 15, 1985·137 cites·19 claims
- 0395US5278634AHigh precision component alignment sensor systemCYBEROPTICS CORP·Filed 1991·Granted Jan 11, 1994·122 cites·25 claims
- 0494US5005978AApparatus and method for the noncontact measurement of drill diameter, runout, and tip positionCYBEROPTICS CORP·Filed 1989·Granted Apr 9, 1991·57 cites·32 claims
- 0594US4680704AOptical sensor apparatus and method for remotely monitoring a utility meter or the likeTELEMETER CORP·Filed 1984·Granted Jul 14, 1987·124 cites·20 claims
- 0693US8388204B2High speed, high resolution, three dimensional solar cell inspection systemHAUGAN CARL E·Filed 2010·Granted Mar 5, 2013·16 cites·47 claims
- 0793US6590658B2Optical alignment systemCYBEROPTICS CORP·Filed 2001·Granted Jul 8, 2003·91 cites·45 claims
- 0891US4455061AMulti-faceted holographic optical element and methods of making and using sameUNIV MINNESOTA·Filed 1980·Granted Jun 19, 1984·68 cites·16 claims
- 0989US7813559B2Image analysis for pick and place machines with in situ component placement inspectionCYBEROPTICS CORP·Filed 2005·Granted Oct 12, 2010·24 cites·20 claims
- 1089US7369334B2Optical device with alignment compensationCYBEROPTICS CORP·Filed 2005·Granted May 6, 2008·18 cites·8 claims
- 1189US4628313AApparatus and method for remotely monitoring a utility meter by use of a liquid crystal displayTELEMETER CORP·Filed 1984·Granted Dec 9, 1986·60 cites·9 claims
- 1287US5897611AHigh precision semiconductor component alignment systemsCYBEROPTICS CORP·Filed 1996·Granted Apr 27, 1999·72 cites·53 claims
- 1386US8670031B2High speed optical inspection system with camera array and compact, integrated illuminatorHAUGAN CARL E·Filed 2010·Granted Mar 11, 2014·15 cites·36 claims
- 1485US6762847B2Laser align sensor with sequencing light sourcesCYBEROPTICS CORP·Filed 2001·Granted Jul 13, 2004·43 cites·53 claims
- 1585US4754328ALaser endoscopeMEDICAL DYNAMICS INC·Filed 1986·Granted Jun 28, 1988·61 cites·15 claims
- 1684US6583884B2Tomographic reconstruction of electronic components from shadow image sensor dataCYBEROPTICS CORP·Filed 2002·Granted Jun 24, 2003·31 cites·23 claims
- 1784US4872747AUse of prisms to obtain anamorphic magnificationCYBEROPTICS CORP·Filed 1987·Granted Oct 10, 1989·54 cites·14 claims
- 1883US6443631B1Optical module with solder bondAVANTI OPTICS CORP·Filed 2001·Granted Sep 3, 2002·28 cites·36 claims
- 1983US4589404ALaser endoscopeMEDICAL DYNAMICS INC·Filed 1984·Granted May 20, 1986·188 cites·12 claims
- 2083US4386414AData processing system utilizing a holographic optical elementUNIV MINNESOTA·Filed 1980·Granted May 31, 1983·33 cites·11 claims
- 2182US7545514B2Pick and place machine with improved component pick image processingCYBEROPTICS CORP·Filed 2006·Granted Jun 9, 2009·11 cites·31 claims
- 2282US6546173B2Optical moduleAVANTI OPTICS CORP·Filed 2001·Granted Apr 8, 2003·23 cites·64 claims
- 2381US5309223ALaser-based semiconductor lead measurement systemCYBEROPTICS CORP·Filed 1991·Granted May 3, 1994·48 cites·49 claims
- 2481US5293048ALaser sensor for detecting the presence of an object in continuous motionCYBEROPTICS CORP·Filed 1992·Granted Mar 8, 1994·41 cites·36 claims
- 2579US4891772APoint and line range sensorsCYBEROPTICS CORP·Filed 1987·Granted Jan 2, 1990·45 cites·33 claims
- 2676US6118538AMethod and apparatus for electronic component lead measurement using light based sensors on a component placement machineCYBEROPTICS CORP·Filed 1997·Granted Sep 12, 2000·40 cites·19 claims
- 2774US5331406AMulti-beam laser sensor for semiconductor lead measurementsCYBEROPTICS CORP·Filed 1992·Granted Jul 19, 1994·36 cites·50 claims
- 2872US7706595B2Pick and place machine with workpiece motion inspectionCYBEROPTICS CORP·Filed 2004·Granted Apr 27, 2010·19 cites·7 claims
- 2972US6608320B1Electronics assembly apparatus with height sensing sensorCYBEROPTICS CORP·Filed 1999·Granted Aug 19, 2003·35 cites·33 claims
- 3071US7555831B2Method of validating component feeder exchangesCYBEROPTICS CORP·Filed 2005·Granted Jul 7, 2009·3 cites·7 claims
- 3171US6538750B1Rotary sensor system with a single detectorCYBEROPTICS CORP·Filed 1999·Granted Mar 25, 2003·33 cites·118 claims
- 3268US6546172B2Optical deviceAVANTI OPTICS CORP·Filed 2001·Granted Apr 8, 2003·14 cites·80 claims
- 3366USRE38025EHigh precision component alignment sensor systemCYBEROPTICS CORP·Filed 1995·Granted Mar 11, 2003·25 cites·54 claims
- 3466US6292261B1Rotary sensor system with at least two detectorsCYBEROPTICS CORP·Filed 1999·Granted Sep 18, 2001·27 cites·77 claims
- 3563US7346420B2Component feeder exchange diagnostic toolCYBEROPTICS CORP·Filed 2007·Granted Mar 18, 2008·1 cites·7 claims
- 3662US8872912B2High speed distributed optical sensor inspection systemLIBERTY TODD D·Filed 2010·Granted Oct 28, 2014·2 cites·24 claims
- 3761US6610991B1Electronics assembly apparatus with stereo vision linescan sensorCYBEROPTICS CORP·Filed 1999·Granted Aug 26, 2003·22 cites·56 claims
- 3860US8681211B2High speed optical inspection system with adaptive focusingHAUGAN CARL E·Filed 2010·Granted Mar 25, 2014·2 cites·28 claims
- 3959US6490048B1Tomographic reconstruction of electronic components from shadow image sensor dataCYBEROPTICS CORP·Filed 1999·Granted Dec 3, 2002·24 cites·14 claims
- 4057US7010855B2Optical moduleCYBEROPTICS CORP·Filed 2003·Granted Mar 14, 2006·4 cites·64 claims
- 4157US6956999B2Optical deviceCYBEROPTICS CORP·Filed 2001·Granted Oct 18, 2005·5 cites·22 claims
- 4256US2009135251A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 4356US2009133249A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 4454US8894259B2Dark field illuminator with large working areaHAUGAN CARL E·Filed 2009·Granted Nov 25, 2014·1 cites·23 claims
- 4554US7346419B2Component feeder exchange diagnostic toolCYBEROPTICS CORP·Filed 2007·Granted Mar 18, 2008·0 cites·4 claims
- 4654US2009046921A1Pick and place machine with improved component pick up inspectionCYBEROPTICS CORP·Filed 2008·Application pending·0 cites
- 4750US6971164B2Optical deviceCYBEROPTICS CORP·Filed 2003·Granted Dec 6, 2005·3 cites·72 claims
- 4850US2007003126A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCASE STEVEN K·Filed 2006·Application pending·0 cites
- 4948US2011175997A1High speed optical inspection system with multiple illumination imageryCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 5047US2006075631A1Pick and place machine with improved component pick up inspectionCASE STEVEN K·Filed 2005·Application pending·0 cites
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →