Inventor · disambiguated record
Steven E. Green
Also filed as: GREEN STEVEN E
38 granted patents·1,290 citations·filing 1994–2022
98Inventor score
Top patents by PatentIndex Score
38 records- 0197US7907280B2Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslationJ A WOOLLAM CO INC·Filed 2008·Granted Mar 15, 2011·94 cites·28 claims
- 0297US7460230B2Deviation angle self compensating substantially achromatic retarderJ A WOOLLAM CO INC·Filed 2006·Granted Dec 2, 2008·108 cites·21 claims
- 0397US7450231B2Deviation angle self compensating substantially achromatic retarderJ A WOOLLAM CO INC·Filed 2006·Granted Nov 11, 2008·105 cites·18 claims
- 0491US6982792B1Spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2003·Granted Jan 3, 2006·49 cites·26 claims
- 0591US5521706ASystem and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer systemJ A WOOLLAM CO INC·Filed 1994·Granted May 28, 1996·107 cites·15 claims
- 0686US7336361B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2005·Granted Feb 26, 2008·15 cites·26 claims
- 0786US5666201AMultiple order dispersive optics system and method of useJ A WOOLLAM CO INC·Filed 1995·Granted Sep 9, 1997·95 cites·20 claims
- 0886US5504582ASystem and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer systemJ A WOOLLAM CO INC·Filed 1994·Granted Apr 2, 1996·83 cites·20 claims
- 0985US5757494ASystem and method for improving data acquisition capability in spectroscopic ellipsometersJ A WOOLLAM CO INC·Filed 1995·Granted May 26, 1998·77 cites·31 claims
- 1084US5956145ASystem and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 1998·Granted Sep 21, 1999·85 cites·21 claims
- 1182US7304737B1Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidenceJ A WOOLLAM CO INC·Filed 2006·Granted Dec 4, 2007·8 cites·17 claims
- 1282US7075649B1Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibrationJ A WOOLLAM CO·Filed 2001·Granted Jul 11, 2006·19 cites·21 claims
- 1382US6795184B1Odd bounce image rotation system in ellipsometer systemsJ A WOOLLAM CO INC·Filed 2001·Granted Sep 21, 2004·24 cites·10 claims
- 1480US7274450B1Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2004·Granted Sep 25, 2007·19 cites·9 claims
- 1580US5963325ADual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Oct 5, 1999·47 cites·9 claims
- 1679US8253940B1UV-IR range variable angle spectroscopic ellipsometerGREEN STEVEN E·Filed 2010·Granted Aug 28, 2012·7 cites·12 claims
- 1779US7245376B2Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeterJ A WOOLLAM CO INC·Filed 2005·Granted Jul 17, 2007·9 cites·33 claims
- 1879US7215424B1Broadband ellipsometer or polarimeter system including at least one multiple element lensJ A WOOLLAM CO INC·Filed 2005·Granted May 8, 2007·6 cites·23 claims
- 1978US7623237B1Sample investigating systemJ A WOOLLAM CO INC·Filed 2006·Granted Nov 24, 2009·5 cites·11 claims
- 2078US6535286B1Positionable multiple detector system for spectrophotomer, ellipsometer, polarimeter and systems, and methodology of useJ A WOOLLAM CO INC·Filed 2000·Granted Mar 18, 2003·24 cites·17 claims
- 2176US8462341B2Mounting for deviation angle self compensating substantially achromatic retarderHE PING·Filed 2011·Granted Jun 11, 2013·4 cites·29 claims
- 2275US5946098AOptical elements for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1997·Granted Aug 31, 1999·41 cites·14 claims
- 2374US5805285AMultiple order dispersive optics system and method of useJ A WOOLLAM CO INC·Filed 1997·Granted Sep 8, 1998·43 cites·17 claims
- 2473US7327456B1Spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2005·Granted Feb 5, 2008·7 cites·9 claims
- 2573US7280194B1Accurate determination of refractive indices of solid, fluid and liquid materialsJ A WOOLLAM CO INC·Filed 2004·Granted Oct 9, 2007·12 cites·22 claims
- 2672US7136162B1Alignment of ellipsometer beam to sample surfaceJ A WOOLLAM CO INC·Filed 2003·Granted Nov 14, 2006·10 cites·18 claims
- 2771US7193710B1Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lensesJ A WOOLLAM CO INC·Filed 2004·Granted Mar 20, 2007·9 cites·5 claims
- 2871US6831740B2Methodology for improving precision of data acquired by spectrophotometer systemsJ A WOOLLAM CO INC·Filed 2001·Granted Dec 14, 2004·13 cites·54 claims
- 2971US6118537AMultiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Sep 12, 2000·39 cites·10 claims
- 3071US6084674AParallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Jul 4, 2000·36 cites·5 claims
- 3170US6483586B1Beam splitting analyzer means in rotating compensator ellipsometerJ A WOOLLAM CO INC·Filed 2001·Granted Nov 19, 2002·8 cites·17 claims
- 3270US6100981ADual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Aug 8, 2000·38 cites·6 claims
- 3369US6141102ASingle trianglular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLAM CO INC·Filed 1999·Granted Oct 31, 2000·39 cites·9 claims
- 3459US11821833B2Fast and accurate Mueller matrix infrared ellipsometerJ A WOOLLAM CO INC·Filed 2022·Granted Nov 21, 2023·0 cites·13 claims
- 3559US11740176B2Fast and accurate mueller matrix infrared spectroscopic ellipsometerJ A WOOLLAM CO INC·Filed 2022·Granted Aug 29, 2023·0 cites·27 claims
- 3658US7151605B1Methodology for providing good data at all wavelengths over a spectroscopic rangeJ A WOOLLAM CO INC·Filed 2004·Granted Dec 19, 2006·5 cites·10 claims
- 3753US8159672B1Sample investigating system and method of useLIPHARDT MARTIN M·Filed 2009·Granted Apr 17, 2012·0 cites·13 claims
- 3842US7301631B1Control of uncertain angle of incidence of beam from Arc lampJ A WOOLLAM CO INC·Filed 2005·Granted Nov 27, 2007·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →