Inventor · disambiguated record
Steven Kasapi
Also filed as: KASAPI STEVEN · KASAPI STEVEN A
25 granted patents·2 pending applications·571 citations·filing 2000–2016
97Inventor score
Files withCREDENCE SYSTEMS CORP12DCG SYSTEMS INC9CREDENCE SYSTEMS COPORATION1KASAPI STEVEN1PAKDAMAN NADER1
Top patents by PatentIndex Score
27 records- 0196US7042563B2Optical coupling for testing integrated circuitsCREDENCE SYSTEMS CORP·Filed 2005·Granted May 9, 2006·35 cites·12 claims
- 0293US7450245B2Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing systemDCG SYSTEMS INC·Filed 2006·Granted Nov 11, 2008·26 cites·32 claims
- 0393US6836131B2Spray cooling and transparent cooling plate thermal management systemCREDENCE SYSTEMS CORP·Filed 2003·Granted Dec 28, 2004·58 cites·30 claims
- 0492US7733100B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2006·Granted Jun 8, 2010·16 cites·29 claims
- 0591US7990167B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2009·Granted Aug 2, 2011·13 cites·20 claims
- 0691US6859031B2Apparatus and method for dynamic diagnostic testing of integrated circuitsCREDENCE SYSTEMS CORP·Filed 2002·Granted Feb 22, 2005·79 cites·19 claims
- 0791US6812464B1Superconducting single photon detectorCREDENCE SYSTEMS CORP·Filed 2000·Granted Nov 2, 2004·101 cites·4 claims
- 0890US6252222B1Differential pulsed laser beam probing of integrated circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Jun 26, 2001·49 cites·26 claims
- 0985US7439730B2Apparatus and method for detecting photon emissions from transistorsDCG SYSTEMS INC·Filed 2005·Granted Oct 21, 2008·10 cites·26 claims
- 1083US9239357B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2012·Granted Jan 19, 2016·3 cites·17 claims
- 1183US6976234B2Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuitsCREDENCE SYSTEMS CORP·Filed 2003·Granted Dec 13, 2005·24 cites·38 claims
- 1282US7049593B2Superconducting single photon detectorUNIV ROCHESTER·Filed 2004·Granted May 23, 2006·33 cites·34 claims
- 1381US8686748B2System and method for modulation mappingKASAPI STEVEN·Filed 2011·Granted Apr 1, 2014·4 cites·19 claims
- 1481US6891363B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2002·Granted May 10, 2005·21 cites·23 claims
- 1580US7616312B2Apparatus and method for probing integrated circuits using laser illuminationDCG SYSTEMS INC·Filed 2005·Granted Nov 10, 2009·12 cites·55 claims
- 1680US7012537B2Apparatus and method for determining voltage using optical observationCREDENCE SYSTEMS CORP·Filed 2004·Granted Mar 14, 2006·23 cites·22 claims
- 1779US7679358B2System and method for voltage noise and jitter measurement using time-resolved emissionDCG SYSTEMS INC·Filed 2007·Granted Mar 16, 2010·9 cites·13 claims
- 1878US6985219B2Optical coupling for testing integrated circuitsCREDENCE SYSTEMS CORP·Filed 2000·Granted Jan 10, 2006·18 cites·2 claims
- 1973US7038442B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted May 2, 2006·5 cites·17 claims
- 2070US7323862B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2006·Granted Jan 29, 2008·4 cites·20 claims
- 2169US6961672B2Universal diagnostic platform for specimen analysisCREDENCE SYSTEMS COPORATION·Filed 2003·Granted Nov 1, 2005·16 cites·20 claims
- 2261US9915700B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2016·Granted Mar 13, 2018·0 cites·21 claims
- 2361US6956365B2System and method for calibration of testing equipment using device photoemissionCREDENCE SYSTEMS CORP·Filed 2003·Granted Oct 18, 2005·10 cites·7 claims
- 2457US7478345B2Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuitsDCG SYSTEMS INC·Filed 2005·Granted Jan 13, 2009·2 cites·32 claims
- 2536US2005002028A1Time resolved emission spectral analysis systemFiled 2003·Application pending·0 cites
- 2633US2006103378A1Apparatus and method for dynamic diagnostic testing of integrated circuitsPAKDAMAN NADER·Filed 2004·Application pending·0 cites
- 2730US7227580B2Knife edge tracking system and methodCREDENCE SYSTEMS CORP·Filed 2003·Granted Jun 5, 2007·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →