Inventor · disambiguated record
Stacey Stone
Also filed as: STONE STACEY
25 granted patents·1 pending application·196 citations·filing 2007–2019
96Inventor score
Top patents by PatentIndex Score
26 records- 0196US8134124B2Method for creating S/tem sample and sample structureBLACKWOOD JEFF·Filed 2007·Granted Mar 13, 2012·42 cites·25 claims
- 0295US8536525B2Method for creating S/TEM sample and sample structureBLACKWOOD JEFF·Filed 2012·Granted Sep 17, 2013·16 cites·14 claims
- 0394US8912490B2Method for preparing samples for imagingFEI CO·Filed 2013·Granted Dec 16, 2014·20 cites·9 claims
- 0493US9601313B2Automated TEM sample preparationFEI CO·Filed 2015·Granted Mar 21, 2017·14 cites·20 claims
- 0593US8859963B2Methods for preparing thin samples for TEM imagingMORIARTY MICHAEL·Filed 2012·Granted Oct 14, 2014·16 cites·17 claims
- 0693US8729469B1Multiple sample attachment to nano manipulator for high throughput sample preparationFEI CO·Filed 2013·Granted May 20, 2014·18 cites·17 claims
- 0792US8822921B2Method for preparing samples for imagingFEI CO·Filed 2013·Granted Sep 2, 2014·11 cites·15 claims
- 0892US8525137B2Method for creating S/TEM sample and sample structureBLACKWOOD JEFF·Filed 2007·Granted Sep 3, 2013·13 cites·26 claims
- 0989US9412560B2Bulk deposition for tilted mill protectionFEI CO·Filed 2013·Granted Aug 9, 2016·7 cites·20 claims
- 1088US9111720B2Method for preparing samples for imagingFEI CO·Filed 2014·Granted Aug 18, 2015·7 cites·12 claims
- 1187US9741536B2High aspect ratio structure analysisFEI CO·Filed 2013·Granted Aug 22, 2017·7 cites·25 claims
- 1284US9653260B2High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamellaFEI CO·Filed 2012·Granted May 16, 2017·7 cites·26 claims
- 1383US9279752B2Method for preparing thin samples for TEM imagingFEI CO·Filed 2014·Granted Mar 8, 2016·4 cites·15 claims
- 1483US9006651B2Method for creating S/TEM sample and sample structureFEI CO·Filed 2013·Granted Apr 14, 2015·2 cites·14 claims
- 1581US10340119B2Automated TEM sample preparationFEI CO·Filed 2017·Granted Jul 2, 2019·2 cites·24 claims
- 1679US9488554B2Method and system for reducing curtaining in charged particle beam sample preparationFEI CO·Filed 2013·Granted Nov 8, 2016·4 cites·19 claims
- 1778US10026590B2Fiducial design for tilted or glancing mill operations with a charged particle beamFEI CO·Filed 2013·Granted Jul 17, 2018·3 cites·8 claims
- 1875US10825651B2Automated TEM sample preparationFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·20 claims
- 1966US9336985B2Method for creating S/TEM sample and sample structureFEI CO·Filed 2015·Granted May 10, 2016·0 cites·16 claims
- 2063US9696372B2Multidimensional structural accessFEI CO·Filed 2013·Granted Jul 4, 2017·1 cites·21 claims
- 2163US8097308B2Protective layer for charged particle beam processingBLACKWOOD JEFF·Filed 2007·Granted Jan 17, 2012·1 cites·24 claims
- 2258US11315756B2Fiducial design for tilted or glancing mill operations with a charged particle beamFEI CO·Filed 2018·Granted Apr 26, 2022·0 cites·10 claims
- 2353US10283317B2High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamellaFEI CO·Filed 2017·Granted May 7, 2019·0 cites·25 claims
- 2449US9384982B2Depositing material into high aspect ratio structuresFEI CO·Filed 2013·Granted Jul 5, 2016·0 cites·19 claims
- 2549US9263306B2Protective layer for charged particle beam processingBLACKWOOD JEFF·Filed 2012·Granted Feb 16, 2016·0 cites·9 claims
- 2642US2015330877A1Method for preparing samples for imagingFEI CO·Filed 2013·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Stacey Stone files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →