Inventor · disambiguated record
Stefan Thurmaier
Also filed as: THURMAIER STEFAN
9 granted patents·2 pending applications·49 citations·filing 2003–2023
83Inventor score
Top patents by PatentIndex Score
11 records- 0187US7382145B2Docking device actuated by pressure meansTHURMAIER STEFAN·Filed 2006·Granted Jun 3, 2008·30 cites·4 claims
- 0272US11163000B2Plate-shaped connection system for the connection of two test units, also connection unit and test system each with such a plate-shaped connection systemTURBODYNAMICS GMBH·Filed 2018·Granted Nov 2, 2021·1 cites·20 claims
- 0367US9671458B2System and guided approach device for guiding a handler or a tester together with a device including a test head for electronic componentsTURBODYNAMICS GMBH·Filed 2013·Granted Jun 6, 2017·2 cites·28 claims
- 0462US10416230B2Aligning device and handling deviceTURBODYNAMICS GMBH·Filed 2014·Granted Sep 17, 2019·1 cites·24 claims
- 0560US6870362B2Docking apparatusMULTITEST ELEKTRONISCHE SYST·Filed 2003·Granted Mar 22, 2005·10 cites·11 claims
- 0659US12135349B2Docking device and method for coupling second devices for interface units, disposition system and docking elementTURBODYNAMICS GMBH·Filed 2022·Granted Nov 5, 2024·0 cites·32 claims
- 0759US9519023B2Module for exchanging an interface unit in a testing system for testing semiconductor components and testing system comprising such a moduleTURBODYNAMICS GMBH·Filed 2013·Granted Dec 13, 2016·2 cites·23 claims
- 0855US2024168087A1Module for exchanging an interface unit, test system with such a module, method for testing semiconductor elements and for exchanging interface unitsTURBODYNAMICS GMBH·Filed 2023·Application pending·0 cites
- 0951US11493554B2Storage unit and disposition system for storing interface unitsTURBODYNAMICS GMBH·Filed 2021·Granted Nov 8, 2022·0 cites·19 claims
- 1050US2024153804A1Handling device for transporting interface units for a test device for testing semiconductorsTURBODYNAMICS GMBH·Filed 2023·Application pending·0 cites
- 1143US6836109B2Guiding apparatus for docking a testing head for electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2003·Granted Dec 28, 2004·3 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →