Inventor · disambiguated record
Stefan Voinea
Also filed as: VOINEA STEFAN · VOINEA STEFAN LUCIAN
7 granted patents·1 pending application·24 citations·filing 2005–2021
80Inventor score
Top patents by PatentIndex Score
8 records- 0188US11280724B2Apparatus and method for performing calibration of a dissolved gas analysis system using optical absorption spectroscopy and use thereof in an apparatus and method for performing dissolved gas analysis (DGA) on a piece of electrical equipmentMORGAN SCHAFFER LTD·Filed 2020·Granted Mar 22, 2022·3 cites·38 claims
- 0288US11137382B2Apparatus and method for performing gas analysis using optical absorption spectroscopy, such as infrared (IR) and/or UV, and use thereof in apparatus and method for performing dissolved gas analysis (DGA) on a piece of electrical equipmentMORGAN SCHAFFER LTD·Filed 2019·Granted Oct 5, 2021·5 cites·56 claims
- 0387US10365209B1Apparatus and method for performing dissolved gas analysis on a piece of electrical equipment using resonant photo-acoustic spectroscopy and use thereofMORGAN SCHAFFER LTD·Filed 2017·Granted Jul 30, 2019·12 cites·25 claims
- 0483US11592434B2Apparatus and method for performing gas analysis using optical absorption spectroscopy, such as infrared (IR) and/or UV, and use thereof in apparatus and method for performing dissolved gas analysis (DGA) on a piece of electrical equipmentMORGAN SCHAFFER LTD·Filed 2021·Granted Feb 28, 2023·1 cites·29 claims
- 0565US11543814B2Methods of modelling systems or performing predictive maintenance of lithographic systemsASML NETHERLANDS BV·Filed 2016·Granted Jan 3, 2023·2 cites·20 claims
- 0665US10670564B2Photoacoustic detector9334 3275 QUEBEC INC·Filed 2016·Granted Jun 2, 2020·1 cites·31 claims
- 0745US11461675B2Methods of modelling systems or performing predictive maintenance of systems, such as lithographic systems and associated lithographic systemsASML NETHERLANDS BV·Filed 2018·Granted Oct 4, 2022·0 cites·20 claims
- 0831US2006042743A1Applicator for magnetic marker and methodMXT INC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →