Inventor · disambiguated record
Steev Wilcox
Also filed as: WILCOX STEEV
10 granted patents·44 citations·filing 2015–2022
87Inventor score
Files withCADENCE DESIGN SYSTEMS INC10
Top patents by PatentIndex Score
10 records- 0193US9606179B1Method and system for improving efficiency of XOR-based test compression using an embedded serializer-deserializerCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Mar 28, 2017·7 cites·18 claims
- 0290US9513335B1Method for using XOR trees for physically efficient scan compression and decompression logicCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Dec 6, 2016·5 cites·10 claims
- 0390US9501590B1Systems and methods for testing integrated circuit designsCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Nov 22, 2016·9 cites·11 claims
- 0490US9470756B1Method for using sequential decompression logic for VLSI test in a physically efficient constructionCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Oct 18, 2016·5 cites·20 claims
- 0587US9817068B1Method and system for improving efficiency of sequential test compression using overscanCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Nov 14, 2017·4 cites·12 claims
- 0687US9465896B1Systems and methods for testing integrated circuit designsCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Oct 11, 2016·6 cites·13 claims
- 0786US9470754B1Elastic compression-optimizing tester bandwidth with compressed test stimuli using overscan and variable serializationCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Oct 18, 2016·3 cites·20 claims
- 0880US9817069B1Method and system for construction of a highly efficient and predictable sequential test decompression logicCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Nov 14, 2017·2 cites·20 claims
- 0979US11748534B1System and method for glitch power estimationCADENCE DESIGN SYSTEMS INC·Filed 2022·Granted Sep 5, 2023·1 cites·18 claims
- 1077US9470755B1Method for dividing testable logic into a two-dimensional grid for physically efficient scanCADENCE DESIGN SYSTEMS INC·Filed 2015·Granted Oct 18, 2016·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →