Inventor · disambiguated record
Stefan Zschiegner
Also filed as: ZSCHIEGNER STEFAN · ZSCHIEGNER STEFAN J
2 granted patents·45 citations·filing 1996–2008
58Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0169US5654971AElectronic circuit or board tester and method of testing an electronic deviceHEWLETT PACKARD CO·Filed 1996·Granted Aug 5, 1997·44 cites·14 claims
- 0244US7893700B2Configuration of shared tester channels to avoid electrical connections across die area boundary on a waferFORMFACTOR INC·Filed 2008·Granted Feb 22, 2011·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →