Inventor · disambiguated record
Sung-Bum Cho
Also filed as: CHO SUNG BUM
21 granted patents·7 pending applications·795 citations·filing 1993–2018
96Inventor score
Files withSAMSUNG ELECTRONICS CO LTD22LG ELECTRONICS INC2PARK HWAN WOOK1SAMSUNG SDS CO LTD1TONG YANG CEMENT CORP1
Top patents by PatentIndex Score
28 records- 0196US6213856B1Conditioner and conditioning disk for a CMP pad, and method of fabricating, reworking, and cleaning conditioning diskSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Apr 10, 2001·166 cites·26 claims
- 0296US6179955B1Dry etching apparatus for manufacturing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 30, 2001·344 cites·8 claims
- 0388US6464794B1Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulatesSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Oct 15, 2002·75 cites·9 claims
- 0485US5285664AAutomatic washing machinesTONG YANG CEMENT CORP·Filed 1993·Granted Feb 15, 1994·66 cites·5 claims
- 0583US7656181B2Apparatus and method for testing circuit characteristics by using eye maskSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 2, 2010·11 cites·22 claims
- 0673US6146492APlasma process apparatus with in situ monitoring, monitoring method, and in situ residue cleaning methodSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Nov 14, 2000·41 cites·23 claims
- 0772US9633711B2Method of managing data of storage devices responsive to temperatureSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Apr 25, 2017·3 cites·15 claims
- 0865US10001756B2Smart watch including a printed circuit board having a hole at the centerSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jun 19, 2018·1 cites·20 claims
- 0965US6797109B2Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulatesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Sep 28, 2004·7 cites·3 claims
- 1065US6499492B1Plasma process apparatus with in situ monitoring, monitoring method, and in situ residue cleaningSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 31, 2002·10 cites·17 claims
- 1164US6891827B2Network-based telephony gateway and network-based telephony methodLG ELECTRONICS INC·Filed 2001·Granted May 10, 2005·9 cites·20 claims
- 1261US6940776B2Semiconductor memory device capable of reading data of signature fuse through normal read operation and method of reading data of signature fuse in semiconductor memory device through normal read operationSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 6, 2005·11 cites·12 claims
- 1359US7574636B2Semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 11, 2009·4 cites·27 claims
- 1454US5659549AMemory test system having a pattern generator for a multi-bit testSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Aug 19, 1997·16 cites·12 claims
- 1552US6494927B2Conditioner and conditioning disk for a CMP pad, and method of fabricating, reworking, and cleaning conditioning diskSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Dec 17, 2002·3 cites·11 claims
- 1652US2006278341A1Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulatesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1750US7222273B2Apparatus and method for testing semiconductor memory devices, capable of selectively changing frequencies of test pattern signalsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 22, 2007·6 cites·21 claims
- 1850US6740169B2Method of reworking a conditioning diskSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 25, 2004·6 cites·11 claims
- 1949US6335284B1Metallization process for manufacturing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 1, 2002·16 cites·12 claims
- 2045US7113579B2Method of conference calling supplemental service using intelligent peripheral in intelligent networkLG ELECTRONICS INC·Filed 2001·Granted Sep 26, 2006·0 cites·21 claims
- 2145US2019385392A1Digital door lock having unique master key and method of operating the digital doorSAMSUNG SDS CO LTD·Filed 2018·Application pending·0 cites
- 2241US2003000648A1Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulatesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
- 2341US2003013315A1Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulatesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
- 2437US2008259695A1Semiconductor Memory Devices Having a Demultiplexer and Related Methods of Testing Such Semiconductor Memory DevicesSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 2536US2012025861A1Test socket and test device having the samePARK HWAN WOOK·Filed 2011·Application pending·0 cites
- 2633US6596087B2Method of cleaning conditioning diskSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jul 22, 2003·0 cites·7 claims
- 2733US2002061650A1Metallization process for manufacturing semiconductor devices and system used in sameFiled 2001·Application pending·0 cites
- 2832US7281179B2Memory device and input signal control method of a memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Oct 9, 2007·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →