Inventor · disambiguated record
Sukehiro Ito
Also filed as: ITO SUKEHIRO
49 granted patents·7 pending applications·149 citations·filing 2004–2023
97Inventor score
Top patents by PatentIndex Score
56 records- 0193US8710439B2Charged particle beam apparatusOMINAMI YUSUKE·Filed 2012·Granted Apr 29, 2014·15 cites·23 claims
- 0291US10464314B2Liquid discharging apparatus and circuit substrateSEIKO EPSON CORP·Filed 2018·Granted Nov 5, 2019·4 cites·17 claims
- 0390US9029766B2Scanning electron microscopeMORISHITA HIDEO·Filed 2012·Granted May 12, 2015·15 cites·14 claims
- 0490US7755045B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 13, 2010·14 cites·15 claims
- 0590US7511271B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2005·Granted Mar 31, 2009·12 cites·16 claims
- 0689US9508527B2Sample base, charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 29, 2016·8 cites·17 claims
- 0787US8629395B2Charged particle beam apparatusMORISHITA HIDEO·Filed 2011·Granted Jan 14, 2014·10 cites·17 claims
- 0886US9016833B2Printing apparatusSEIKO EPSON CORP·Filed 2013·Granted Apr 28, 2015·4 cites·4 claims
- 0986US8294097B2Charged particle radiation deviceKATANE JUNICHI·Filed 2010·Granted Oct 23, 2012·11 cites·14 claims
- 1083US10241062B2Charged particle beam device, sample observation method, sample platform, observation system, and light emitting memberHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 26, 2019·4 cites·23 claims
- 1183US10160202B2Liquid discharging apparatusSEIKO EPSON CORP·Filed 2018·Granted Dec 25, 2018·2 cites·9 claims
- 1283US8933400B2Inspection or observation apparatus and sample inspection or observation methodOMINAMI YUSUKE·Filed 2012·Granted Jan 13, 2015·5 cites·13 claims
- 1382US8608270B2Printing device, discharge test device and discharge test methodSEIKO EPSON CORP·Filed 2013·Granted Dec 17, 2013·2 cites·8 claims
- 1482US8026491B2Charged particle beam apparatus and method for charged particle beam adjustmentHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 27, 2011·9 cites·5 claims
- 1581US9418818B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 16, 2016·4 cites·18 claims
- 1681US8921786B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 30, 2014·3 cites·20 claims
- 1780US10773519B2Liquid ejecting apparatusSEIKO EPSON CORP·Filed 2019·Granted Sep 15, 2020·1 cites·5 claims
- 1878US11034146B2Liquid discharge head control circuit, liquid discharge head, and liquid discharge apparatusSEIKO EPSON CORP·Filed 2019·Granted Jun 15, 2021·1 cites·8 claims
- 1974US8692195B2Charged particle radiation deviceHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 8, 2014·2 cites·16 claims
- 2072US9543111B2Charged particle beam deviceOMINAMI YUSUKE·Filed 2011·Granted Jan 10, 2017·3 cites·23 claims
- 2171US8866371B2Electric field discharge-type electron sourceHITACHI HIGH TECH CORP·Filed 2012·Granted Oct 21, 2014·2 cites·10 claims
- 2267US9202667B2Charged particle radiation device with bandpass detectionHATANO MICHIO·Filed 2010·Granted Dec 1, 2015·2 cites·11 claims
- 2366US9466460B2Charged particle-beam device and specimen observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 11, 2016·1 cites·22 claims
- 2466US9287083B2Charged particle beam deviceTOMITA SHINICHI·Filed 2011·Granted Mar 15, 2016·3 cites·8 claims
- 2565US8097848B2Scanning electron microscopeHATANO MICHIO·Filed 2009·Granted Jan 17, 2012·2 cites·20 claims
- 2665US7154089B2Scanning electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted Dec 26, 2006·6 cites·7 claims
- 2763US11958289B2Liquid ejecting head control circuit and liquid ejecting apparatusSEIKO EPSON CORP·Filed 2021·Granted Apr 16, 2024·0 cites·6 claims
- 2863US8143573B2Charged particle beam apparatusITO SUKEHIRO·Filed 2009·Granted Mar 27, 2012·1 cites·20 claims
- 2962US9105442B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 11, 2015·0 cites·17 claims
- 3061US12358281B2Liquid ejection apparatus and print headSEIKO EPSON CORP·Filed 2023·Granted Jul 15, 2025·0 cites·12 claims
- 3161US9053902B2Charged-particle radiation apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Jun 9, 2015·1 cites·18 claims
- 3261US8991970B2Printing device, discharge test device and discharge test methodSEIKO EPSON CORP·Filed 2013·Granted Mar 31, 2015·0 cites·8 claims
- 3360US9236217B2Inspection or observation apparatus and sample inspection or observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 12, 2016·0 cites·3 claims
- 3460US9012842B2Charged particle beam device and inclined observation image display methodHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 21, 2015·1 cites·5 claims
- 3558US2010090109A1Scanning electron microscopeHATANO MICHIO·Filed 2009·Application pending·0 cites
- 3657US12479204B2Liquid ejection apparatus and print headSEIKO EPSON CORP·Filed 2023·Granted Nov 25, 2025·0 cites·10 claims
- 3757US8220906B2Liquid jet head, a liquid jet apparatus and a method for manufacturing a liquid jet headITO SUKEHIRO·Filed 2009·Granted Jul 17, 2012·1 cites·14 claims
- 3856US12377652B2Liquid ejection apparatus and print headSEIKO EPSON CORP·Filed 2023·Granted Aug 5, 2025·0 cites·14 claims
- 3956US2024109318A1Liquid ejection apparatus and print headSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 4054US9165741B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleOMINAMI YUSUKE·Filed 2012·Granted Oct 20, 2015·0 cites·18 claims
- 4153US9824854B2Charged particle beam device, image generation method, observation systemHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 21, 2017·0 cites·18 claims
- 4253US9673020B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 6, 2017·0 cites·16 claims
- 4353US7557346B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 7, 2009·0 cites·6 claims
- 4452US8388089B2Printing device, discharge test device and discharge test methodITO SUKEHIRO·Filed 2010·Granted Mar 5, 2013·0 cites·9 claims
- 4549US10773521B2Cable group and cableSEIKO EPSON CORP·Filed 2019·Granted Sep 15, 2020·0 cites·6 claims
- 4649US9466457B2Observation apparatus and optical axis adjustment methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 11, 2016·0 cites·16 claims
- 4748US11198289B2Liquid discharge head control circuit, liquid discharge head, and liquid discharge apparatusSEIKO EPSON CORP·Filed 2019·Granted Dec 14, 2021·0 cites·12 claims
- 4848US9208995B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 8, 2015·0 cites·14 claims
- 4947US10744761B2Liquid ejecting apparatusSEIKO EPSON CORP·Filed 2019·Granted Aug 18, 2020·0 cites·9 claims
- 5045US9263232B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 16, 2016·0 cites·15 claims
Showing the top 50 of 56 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →