Inventor · disambiguated record
Sung-Nien Kuo
Also filed as: KUO SUNG-NIEN
1 granted patent·2 pending applications·3 citations·filing 2010–2023
21Inventor score
Top patents by PatentIndex Score
3 records- 0157US8283941B2Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluationKUO SUNG-NIEN·Filed 2010·Granted Oct 9, 2012·3 cites·18 claims
- 0254US2025031458A1Semiconductor structure and method of preventing charging damage thereofUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 0351US2024168084A1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →