Inventor · disambiguated record
Sung-Bin Lin
Also filed as: LIN SUNG-BIN
12 granted patents·1 pending application·16 citations·filing 2005–2017
85Inventor score
Top patents by PatentIndex Score
13 records- 0174US9530783B2Method of manufacturing non-volatile memory having SONOS memory cellsUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·2 cites·4 claims
- 0269US9793278B1Structure of memory cell with asymmetric cell structure and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 17, 2017·2 cites·22 claims
- 0368US7193265B2Single-poly EEPROMUNITED MICROELECTRONICS CORP·Filed 2005·Granted Mar 20, 2007·4 cites·16 claims
- 0462US9136276B1Memory cell structure and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 15, 2015·1 cites·17 claims
- 0561US9530511B1Operating method of memory deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·1 cites·16 claims
- 0660US7714374B2Structure and fabrication method of flash memoryUNITED MICROELECTRONICS CORP·Filed 2007·Granted May 11, 2010·2 cites·13 claims
- 0758US8729599B2Semiconductor deviceCHANG YUAN-HSIANG·Filed 2011·Granted May 20, 2014·1 cites·8 claims
- 0854US8921888B2Method of making semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Dec 30, 2014·0 cites·12 claims
- 0954US8436411B2Non-volatile memoryLIN SUNG-BIN·Filed 2009·Granted May 7, 2013·3 cites·16 claims
- 1040US9659782B2Memory device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 23, 2017·0 cites·6 claims
- 1139US10510758B2Semiconductor memory device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Dec 17, 2019·0 cites·21 claims
- 1236US10096611B2Trapping gate forming process and flash cellUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 9, 2018·0 cites·19 claims
- 1336US2009179256A1Memory having separated charge trap spacers and method of forming the sameLIN SUNG-BIN·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →