Inventor · disambiguated record
Susumu Tanida
Also filed as: TANIDA SUSUMU
18 granted patents·3 pending applications·283 citations·filing 1995–2012
95Inventor score
Top patents by PatentIndex Score
21 records- 0189US5905690ASynchronous semiconductor device having circuitry capable of surely resetting test modeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 18, 1999·83 cites·15 claims
- 0277US6337814B1Semiconductor memory device having reference potential generating circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 8, 2002·25 cites·7 claims
- 0374US6798679B2Semiconductor memory moduleRENESAS TECH CORP·Filed 2002·Granted Sep 28, 2004·18 cites·7 claims
- 0465US6031782ASemiconductor memory device provided with an interface circuit consuming a reduced amount of current consumptionMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 29, 2000·25 cites·17 claims
- 0564US6777920B2Internal power-supply potential generating circuitRENESAS TECH CORP·Filed 2002·Granted Aug 17, 2004·14 cites·5 claims
- 0658US7902909B2Charge pump circuitRENESAS ELECTRONICS CORP·Filed 2009·Granted Mar 8, 2011·3 cites·1 claims
- 0756US5666317ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Sep 9, 1997·14 cites·3 claims
- 0856US5574691ASemiconductor memory device having circuit for activating predetermined rows of memory cells upon detection of disturb refresh testMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Nov 12, 1996·14 cites·11 claims
- 0950US6034904ASemiconductor memory device having selection circuit for arbitrarily setting a word line to selected state at high speed in test modeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 7, 2000·16 cites·1 claims
- 1050US5962868ASemiconductor device having contact check circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 5, 1999·23 cites·4 claims
- 1150US5519659ASemiconductor memory device having circuit for activating predetermined rows of memory cells upon detection of disturb refresh testMITSUBISHI ELECTRIC CORP·Filed 1995·Granted May 21, 1996·13 cites·3 claims
- 1249US2012249225A1Charge pump circuitSUZUKI TAKANOBU·Filed 2012·Application pending·0 cites
- 1348US8248154B2Charge pump circuitSUZUKI TAKANOBU·Filed 2011·Granted Aug 21, 2012·0 cites·1 claims
- 1444US5715212ASemiconductor memory device comprising address transition detecting circuit having stable response characteristic for address signal conversionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 3, 1998·9 cites·7 claims
- 1544US5631867ASemiconductor storage device requiring short time for program voltage to riseMITSUBISHI ELECTRIC CORP·Filed 1995·Granted May 20, 1997·10 cites·16 claims
- 1641US2005030815A1Semiconductor memory moduleMITSUBISHI ELECTRIC CORP·Filed 2004·Application pending·0 cites
- 1740US5587956ASemiconductor memory device having function of generating boosted potentialMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Dec 24, 1996·7 cites·6 claims
- 1838US6285602B1Semiconductor memory device provided with I/O clamp circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 4, 2001·5 cites·9 claims
- 1937US6269044B1Semiconductor memory device employing an abnormal current consumption detection schemeMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 31, 2001·1 cites·8 claims
- 2034US5694352ASemiconductor memory device having layout area of periphery of output pad reducedMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 2, 1997·3 cites·4 claims
- 2131US2003193824A1Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →