Inventor · disambiguated record
Tatsuya Asahata
Also filed as: ASAHATA TATSUYA
52 granted patents·7 pending applications·108 citations·filing 2003–2021
97Inventor score
Files withHITACHI HIGH TECH SCIENCE CORP53SII NANOTECHNOLOGY INC3MAN XIN1UEMOTO ATSUSHI1YAMAMOTO YO1
Top patents by PatentIndex Score
59 records- 0197US10088401B2Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Oct 2, 2018·14 cites·13 claims
- 0295US10677697B2Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Jun 9, 2020·5 cites·5 claims
- 0393US9620333B2Charged particle beam apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Apr 11, 2017·9 cites·7 claims
- 0492US11073453B2Automatic sample preparation apparatus and automatic sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Jul 27, 2021·2 cites·7 claims
- 0591US9347896B2Cross-section processing-and-observation method and cross-section processing-and-observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted May 24, 2016·8 cites·13 claims
- 0691US9275827B2Charged particle beam apparatus having needle probe that tracks target position changesHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Mar 1, 2016·7 cites·11 claims
- 0786US9111717B2Ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 18, 2015·7 cites·6 claims
- 0885US10236159B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Mar 19, 2019·3 cites·12 claims
- 0983US8637819B2Cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jan 28, 2014·5 cites·6 claims
- 1081US9548185B2Cross section processing method and cross section processing apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Jan 17, 2017·4 cites·18 claims
- 1179US11835438B2Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Dec 5, 2023·0 cites·3 claims
- 1279US9966226B2Cross-section processing and observation method and cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted May 8, 2018·2 cites·6 claims
- 1377US9269539B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Feb 23, 2016·2 cites·6 claims
- 1476US8822911B2Focused ion beam apparatus and method of adjusting ion beam opticsHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Sep 2, 2014·3 cites·5 claims
- 1576US6825468B2Fine stencil structure correction deviceSII NANOTECHNOLOGY INC·Filed 2003·Granted Nov 30, 2004·12 cites·28 claims
- 1675US11282672B2Charged particle beam apparatus and sample processing observation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Mar 22, 2022·1 cites·10 claims
- 1775US9934938B2Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage mediumHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Apr 3, 2018·3 cites·6 claims
- 1875US7459699B2Method of determining processing position in charged particle beam apparatus, and infrared microscope used in the methodSII NANOTECHNOLOGY INC·Filed 2005·Granted Dec 2, 2008·4 cites·6 claims
- 1974US9080945B2Cross-section processing and observation method and cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jul 14, 2015·2 cites·11 claims
- 2073US2020278281A1Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Application pending·0 cites
- 2172US7518109B2Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sampleSII NANOTECHNOLOGY INC·Filed 2007·Granted Apr 14, 2009·3 cites·20 claims
- 2271US9202671B2Charged particle beam apparatus and sample processing method using charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Dec 1, 2015·2 cites·6 claims
- 2371US8642980B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Feb 4, 2014·2 cites·6 claims
- 2471US8191168B2Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscopeMAN XIN·Filed 2008·Granted May 29, 2012·3 cites·5 claims
- 2570US11742177B2Charged particle beam apparatus and control method thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Aug 29, 2023·0 cites·8 claims
- 2670US9336987B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted May 10, 2016·2 cites·6 claims
- 2765US10636615B2Composite beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Apr 28, 2020·0 cites·8 claims
- 2865US9368323B2Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Jun 14, 2016·1 cites·5 claims
- 2964US9024280B2Composite charged particle beam apparatusUEMOTO ATSUSHI·Filed 2012·Granted May 5, 2015·2 cites·6 claims
- 3063US11177113B2Charged particle beam apparatus and control method thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Nov 16, 2021·0 cites·10 claims
- 3159US10204759B2Composite beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Feb 12, 2019·0 cites·10 claims
- 3258US10096449B2Cross-section processing-and-observation method and cross-section processing-and-observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Oct 9, 2018·0 cites·17 claims
- 3356US11361936B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Jun 14, 2022·0 cites·8 claims
- 3456US10622187B2Charged particle beam apparatus and sample processing observation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Apr 14, 2020·0 cites·9 claims
- 3555US9245713B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Jan 26, 2016·0 cites·9 claims
- 3655US2021293668A1Method for observing biological tissue sampleHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 3753US11749493B2Liquid metal ion source and focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Sep 5, 2023·0 cites·10 claims
- 3853US2025140513A1Charged particle beam deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 3952US2024087841A1Sample piece relocating deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 4052US2025140518A1Machining method and charged particle beam deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 4152US2024379323A1Control method, charged particle beam device, and programHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 4250US11424100B2Charged particle beam irradiation apparatus and control methodHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Aug 23, 2022·0 cites·16 claims
- 4350US9318303B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Apr 19, 2016·0 cites·15 claims
- 4450US9218939B2Focused ion beam system, sample processing method using the same, and sample processing program using focused ion beamHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Dec 22, 2015·0 cites·20 claims
- 4550US2025014859A1Computer, program, and charged particle beam processing systemHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 4649US10629411B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Apr 21, 2020·0 cites·20 claims
- 4748US11482398B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Oct 25, 2022·0 cites·2 claims
- 4848US11239046B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Feb 1, 2022·0 cites·3 claims
- 4948US10658147B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted May 19, 2020·0 cites·7 claims
- 5048US10485087B2Portable information terminal, beam irradiation system, and programHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Nov 19, 2019·0 cites·17 claims
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →