Inventor · disambiguated record
Tadahiko Baba
Also filed as: BABA TADAHIKO
4 granted patents·1 pending application·98 citations·filing 1994–2009
76Inventor score
Files withADVANTEST CORP5
Top patents by PatentIndex Score
5 records- 0187US5646948AApparatus for concurrently testing a plurality of semiconductor memories in parallelADVANTEST CORP·Filed 1994·Granted Jul 8, 1997·81 cites·15 claims
- 0266US7783452B2Signal measurement apparatus and test apparatusADVANTEST CORP·Filed 2007·Granted Aug 24, 2010·6 cites·12 claims
- 0351US7965093B2Test apparatus and test method for testing a device under test using a multi-strobeADVANTEST CORP·Filed 2009·Granted Jun 21, 2011·2 cites·20 claims
- 0451US6885956B2Semiconductor test apparatusADVANTEST CORP·Filed 2002·Granted Apr 26, 2005·9 cites·5 claims
- 0535US2008228417A1Changing point detecting circuit, jitter measuring apparatus and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →