Inventor · disambiguated record

Tanay Bansal

Also filed as: BANSAL TANAY

1 granted patent·23 citations·filing 2019–2019

41Inventor score

Technology areasH01J

Files withKLA TENCOR CORP1

Top patents by PatentIndex Score

1 record

0188US10672588B1Using deep learning based defect detection and classification schemes for pixel level image quantificationKLA TENCOR CORP·Filed 2019·Granted Jun 2, 2020·23 cites·18 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →