Inventor · disambiguated record
Takanori Eguchi
Also filed as: EGUCHI TAKANORI
2 granted patents·13 citations·filing 2010–2012
56Inventor score
Top patents by PatentIndex Score
2 records- 0182US8498831B2Semiconductor device, semiconductor device testing method, and data processing systemIDE AKIRA·Filed 2010·Granted Jul 30, 2013·10 cites·45 claims
- 0259US8390318B2Semiconductor device having calibration circuit for adjusting output impedance of output buffer circuitYOKOU HIDEYUKI·Filed 2012·Granted Mar 5, 2013·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →