Inventor · disambiguated record
Tanbir Hasan
Also filed as: HASAN TANBIR
3 granted patents·1 pending application·3 citations·filing 2017–2021
56Inventor score
Files withASML NETHERLANDS BV4
Top patents by PatentIndex Score
4 records- 0179US11029614B2Level sensor apparatus, method of measuring topographical variation across a substrate, method of measuring variation of a physical parameter related to a lithographic process, and lithographic apparatusASML NETHERLANDS BV·Filed 2017·Granted Jun 8, 2021·2 cites·20 claims
- 0276US10908515B2Method and apparatus for pattern fidelity controlASML NETHERLANDS BV·Filed 2017·Granted Feb 2, 2021·1 cites·20 claims
- 0369US11669020B2Method and apparatus for pattern fidelity controlASML NETHERLANDS BV·Filed 2021·Granted Jun 6, 2023·0 cites·20 claims
- 0443US2024062356A1Data-driven prediction and identification of failure modes based on wafer-level analysis and root cause analysis for semiconductor processingASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →