Inventor · disambiguated record
Takayuki Hayashizaki
Also filed as: HAYASHIZAKI TAKAYUKI
17 granted patents·3 pending applications·119 citations·filing 2005–2022
92Inventor score
Top patents by PatentIndex Score
20 records- 0194US10859599B2Electrical connection apparatusNIHON MICRONICS KK·Filed 2018·Granted Dec 8, 2020·8 cites·4 claims
- 0292US7629807B2Electrical test probeNIHON MICRONICS KK·Filed 2005·Granted Dec 8, 2009·31 cites·9 claims
- 0391US7586321B2Electrical test probe and electrical test probe assemblyNIHON MICRONICS KK·Filed 2007·Granted Sep 8, 2009·19 cites·10 claims
- 0487US7888958B2Current test probe having a solder guide portion, and related probe assembly and production methodNIHON MICRONICS KK·Filed 2006·Granted Feb 15, 2011·20 cites·13 claims
- 0583US10768207B2Electrical connection deviceNIHON MICRONICS KK·Filed 2018·Granted Sep 8, 2020·2 cites·7 claims
- 0675US7862733B2Method for manufacturing a probeNIHON MICRONICS KK·Filed 2007·Granted Jan 4, 2011·5 cites·10 claims
- 0770US8063651B2Contact for electrical test of electronic devices, probe assembly and method for manufacturing the sameKAMATA SHOJI·Filed 2009·Granted Nov 22, 2011·5 cites·9 claims
- 0869US7736690B2Method for manufacturing an electrical test probeNIHON MICRONICS KK·Filed 2008·Granted Jun 15, 2010·6 cites·10 claims
- 0967US7679389B2Probe for electrical test and electrical connecting apparatus using itNIHON MICRONICS KK·Filed 2005·Granted Mar 16, 2010·5 cites·7 claims
- 1067US7523539B2Method of manufacturing a probeNIHON MICRONICS KK·Filed 2007·Granted Apr 28, 2009·4 cites·8 claims
- 1165US7816931B2Contact for electrical test, electrical connecting apparatus using it, and method of producing the contactNIHON MICRONICS KK·Filed 2009·Granted Oct 19, 2010·4 cites·2 claims
- 1264US8975908B2Electrical test probe and probe assembly with improved probe tipHAYASHIZAKI TAKAYUKI·Filed 2011·Granted Mar 10, 2015·2 cites·11 claims
- 1360US7557593B2Probe for electrical test and probe assemblyNIHON MICRONICS KK·Filed 2007·Granted Jul 7, 2009·3 cites·9 claims
- 1454US7721429B2Method for manufacturing a probeNIHON MICRONICS KK·Filed 2008·Granted May 25, 2010·5 cites·10 claims
- 1552US11378591B2Electrical connection deviceNIHON MICRONICS KK·Filed 2020·Granted Jul 5, 2022·0 cites·8 claims
- 1645US2008191727A1Probe and probe assemblyNIHON MICRONICS KK·Filed 2008·Application pending·0 cites
- 1742US2024168056A1Probe and probe cardNIHON MICRONICS KK·Filed 2022·Application pending·0 cites
- 1841US12000867B2Electrical connecting deviceNIHON MICRONICS KK·Filed 2020·Granted Jun 4, 2024·0 cites·9 claims
- 1940US9435854B2Electrical contactor and contact method for the sameNIHON MICRONICS KK·Filed 2013·Granted Sep 6, 2016·0 cites·5 claims
- 2037US2007018633A1Probe use in electric testNIHON MICRONICS KK·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →