Inventor · disambiguated record
Takenori Hiroki
Also filed as: HIROKI TAKENORI
3 granted patents·1 pending application·19 citations·filing 2004–2004
66Inventor score
Technology areasG01Q
Top patents by PatentIndex Score
4 records- 0157US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 0246US7388199B2Probe manufacturing method, probe, and scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jun 17, 2008·5 cites·17 claims
- 0343US7350404B2Scanning type probe microscope and probe moving control method thereforHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Apr 1, 2008·3 cites·4 claims
- 0433US2007180889A1Probe replacement method for scanning probe microscopeMURAYAMA KEN·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →