Inventor · disambiguated record
Tamao Ishikawa
Also filed as: ISHIKAWA TAMAO
3 granted patents·1 pending application·19 citations·filing 2008–2010
66Inventor score
Top patents by PatentIndex Score
4 records- 0188US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0277US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0351US8139845B2Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating systemNOGUCHI TAKASHI·Filed 2008·Granted Mar 20, 2012·2 cites·11 claims
- 0430US2011296362A1Semiconductor defect integrated projection method and defect inspection support apparatus equipped with semiconductor defect integrated projection functionISHIKAWA TAMAO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →