Inventor · disambiguated record
Takaji Ishikawa
Also filed as: ISHIKAWA TAKAJI
5 granted patents·53 citations·filing 2003–2008
79Inventor score
Top patents by PatentIndex Score
5 records- 0178US8134381B2Connection board, probe card, and electronic device test apparatus comprising sameABE YOSHIHIRO·Filed 2008·Granted Mar 13, 2012·8 cites·11 claims
- 0278US7482821B2Probe card and the production methodADVANTEST CORP·Filed 2005·Granted Jan 27, 2009·7 cites·2 claims
- 0376US6932635B2Electronic component testing socket and electronic component testing apparatus using the sameADVANTEST CORP·Filed 2003·Granted Aug 23, 2005·20 cites·15 claims
- 0473US7667471B2Contact pin probe card and electronic device test apparatus using sameADVANTEST CORP·Filed 2004·Granted Feb 23, 2010·17 cites·21 claims
- 0545US7484285B2System for mating and demating multiple connectors mounted on board of semiconductor test apparatusADVANTEST CORP·Filed 2003·Granted Feb 3, 2009·1 cites·4 claims
Join the waitlist — get patent alerts
Get an alert when Takaji Ishikawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →