Inventor · disambiguated record
Takahiro Jingu
Also filed as: JINGU TAKAHIRO
66 granted patents·14 pending applications·835 citations·filing 1997–2017
99Inventor score
Top patents by PatentIndex Score
80 records- 0197US7248352B2Method for inspecting defect and apparatus for inspecting defectHITACHI HIGH TECH CORP·Filed 2003·Granted Jul 24, 2007·66 cites·4 claims
- 0297US7098055B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 29, 2006·36 cites·7 claims
- 0396US7940383B2Method of detecting defects on an objectHITACHI LTD·Filed 2009·Granted May 10, 2011·42 cites·20 claims
- 0496US7639350B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Dec 29, 2009·25 cites·20 claims
- 0596US6411377B1Optical apparatus for defect and particle size inspectionHITACHI LTD·Filed 1999·Granted Jun 25, 2002·174 cites·29 claims
- 0695US7369223B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2005·Granted May 6, 2008·25 cites·5 claims
- 0795US6797975B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2001·Granted Sep 28, 2004·56 cites·6 claims
- 0894US7777876B2Inspection method and inspection deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 17, 2010·27 cites·19 claims
- 0993US7443496B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Oct 28, 2008·16 cites·15 claims
- 1092US8013989B2Defects inspecting apparatus and defects inspecting methodHITACHI HIGH TECH CORP·Filed 2010·Granted Sep 6, 2011·7 cites·16 claims
- 1192US7037735B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2002·Granted May 2, 2006·43 cites·18 claims
- 1291US9568439B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 14, 2017·3 cites·16 claims
- 1391US7692779B2Apparatus and method for testing defectsHITACHI LTD·Filed 2005·Granted Apr 6, 2010·12 cites·20 claims
- 1491US7262425B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 28, 2007·13 cites·18 claims
- 1591US6936835B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2002·Granted Aug 30, 2005·34 cites·22 claims
- 1689US9007581B2Inspection method and inspection deviceHORAI IZUO·Filed 2012·Granted Apr 14, 2015·13 cites·26 claims
- 1788US9645094B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted May 9, 2017·2 cites·4 claims
- 1888US6597448B1Apparatus and method of inspecting foreign particle or defect on a sampleHITACHI LTD·Filed 2000·Granted Jul 22, 2003·44 cites·20 claims
- 1987US7417721B2Defect detector and defect detecting methodHITACHI LTD·Filed 2003·Granted Aug 26, 2008·20 cites·21 claims
- 2086US7115892B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 3, 2006·7 cites·5 claims
- 2185US6002989ASystem for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss valueHITACHI LTD·Filed 1997·Granted Dec 14, 1999·84 cites·25 claims
- 2284US7315363B2Inspection method and inspection apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 1, 2008·14 cites·8 claims
- 2383US7925390B2Mini environment apparatus, inspection apparatus, manufacturing apparatus and cleaning method of spaceHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 12, 2011·14 cites·1 claims
- 2483US7256412B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Aug 14, 2007·5 cites·6 claims
- 2582US7586594B2Method for inspecting defect and apparatus for inspecting defectHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 8, 2009·4 cites·6 claims
- 2681US9602780B2Apparatus for inspecting defect with time/spatial division optical systemITO MASAAKI·Filed 2011·Granted Mar 21, 2017·5 cites·27 claims
- 2780US8508727B2Defects inspecting apparatus and defects inspecting methodUTO SACHIO·Filed 2012·Granted Aug 13, 2013·2 cites·18 claims
- 2880US7903244B2Method for inspecting defect and apparatus for inspecting defectHITACHI HIGH TECH CORP·Filed 2009·Granted Mar 8, 2011·3 cites·2 claims
- 2979US8831899B2Inspecting apparatus and an inspecting methodNEMOTO KAZUNORI·Filed 2009·Granted Sep 9, 2014·9 cites·30 claims
- 3079US8289507B2Method of apparatus for detecting particles on a specimenHAMAMATSU AKIRA·Filed 2011·Granted Oct 16, 2012·2 cites·12 claims
- 3179US7817261B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 19, 2010·4 cites·14 claims
- 3279US7411207B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2007·Granted Aug 12, 2008·4 cites·10 claims
- 3378US8101935B2Inspection apparatus and inspection methodTAKAHASHI KAZUO·Filed 2008·Granted Jan 24, 2012·4 cites·11 claims
- 3478US7952700B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·12 claims
- 3578US7768634B2Defects inspecting apparatus and defects inspecting methodHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 3, 2010·3 cites·16 claims
- 3672US9588054B2Defect inspection method, low light detecting method and low light detectorURANO YUTA·Filed 2011·Granted Mar 7, 2017·2 cites·6 claims
- 3772US9568437B2Inspection deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 14, 2017·1 cites·20 claims
- 3872US8094295B2Inspection method and inspection apparatusHAMAMATSU AKIRA·Filed 2009·Granted Jan 10, 2012·1 cites·1 claims
- 3969US8547546B2Surface-defect inspection deviceSUZUKI KATSUYA·Filed 2010·Granted Oct 1, 2013·2 cites·10 claims
- 4066US8587777B2Examination method and examination deviceJINGU TAKAHIRO·Filed 2009·Granted Nov 19, 2013·2 cites·12 claims
- 4163US9823065B2Surface measurement apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 21, 2017·1 cites·25 claims
- 4263US8269959B2Inspection method and inspection apparatusHAMAMATSU AKIRA·Filed 2012·Granted Sep 18, 2012·0 cites·7 claims
- 4362US6998630B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 14, 2006·2 cites·16 claims
- 4461US7586593B2Inspection method and inspection apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 8, 2009·0 cites·13 claims
- 4559US8228495B2Defects inspecting apparatus and defects inspecting methodUTO SACHIO·Filed 2011·Granted Jul 24, 2012·0 cites·14 claims
- 4658US2007257214A1Method and apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2007·Application pending·0 cites
- 4757US8563958B2Inspection apparatus and inspection methodTAKAHASHI KAZUO·Filed 2011·Granted Oct 22, 2013·0 cites·20 claims
- 4857US8072597B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceNISHIYAMA HIDETOSHI·Filed 2008·Granted Dec 6, 2011·0 cites·14 claims
- 4956US7791721B2Surface inspection with variable digital filteringHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 7, 2010·0 cites·18 claims
- 5056US2016178360A1Surface shape measuring apparatusHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
Showing the top 50 of 80 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →