Inventor · disambiguated record
Taher Kagalwala
Also filed as: KAGALWALA TAHER · KAGALWALA TAHER E
4 granted patents·1 pending application·19 citations·filing 2014–2019
71Inventor score
Files withGLOBALFOUNDRIES INC5
Top patents by PatentIndex Score
5 records- 0186US10664638B1Measuring complex structures in semiconductor fabricationGLOBALFOUNDRIES INC·Filed 2018·Granted May 26, 2020·7 cites·23 claims
- 0281US10030971B2Measurement system and method for measuring in thin filmsGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 24, 2018·5 cites·13 claims
- 0381US9262819B1System and method for estimating spatial characteristics of integrated circuitsGLOBALFOUNDRIES INC·Filed 2014·Granted Feb 16, 2016·6 cites·20 claims
- 0472US11300948B2Process control of semiconductor fabrication based on spectra quality metricsGLOBALFOUNDRIES INC·Filed 2019·Granted Apr 12, 2022·1 cites·20 claims
- 0536US2020279783A1Process control of semiconductor fabrication based on linkage between different fabrication stepsGLOBALFOUNDRIES INC·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →