Inventor · disambiguated record
Takashi Kaito
Also filed as: KAITO TAKASHI
25 granted patents·4 pending applications·522 citations·filing 1985–2019
96Inventor score
Top patents by PatentIndex Score
29 records- 0194US5525806AFocused charged beam apparatus, and its processing and observation methodSEIKO INSTR INC·Filed 1994·Granted Jun 11, 1996·102 cites·6 claims
- 0291US6395347B1Micromachining method for workpiece observationSEIKO INSTR INC·Filed 1994·Granted May 28, 2002·68 cites·14 claims
- 0389US4876112AProcess for forming metallic patterned filmSEIKO INSTR INC·Filed 1987·Granted Oct 24, 1989·97 cites·22 claims
- 0486US6864481B2Probe for scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2002·Granted Mar 8, 2005·62 cites·22 claims
- 0585US5028780APreparation and observation method of micro-sectionSEIKO INSTR INC·Filed 1989·Granted Jul 2, 1991·35 cites·3 claims
- 0682US5023453AApparatus for preparation and observation of a topographic sectionSEIKO INSTR INC·Filed 1989·Granted Jun 11, 1991·29 cites·4 claims
- 0778US7550723B2Atom probe apparatus and method for working sample preliminary for the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 23, 2009·5 cites·11 claims
- 0876US8274063B2Composite focused ion beam device, process observation method using the same, and processing methodKAITO TAKASHI·Filed 2008·Granted Sep 25, 2012·4 cites·20 claims
- 0976US7235783B2Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working methodSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 26, 2007·3 cites·16 claims
- 1076US4930439AMask-repairing deviceSEIKO INSTR INC·Filed 1988·Granted Jun 5, 1990·21 cites·19 claims
- 1171US8269194B2Composite focused ion beam device, and processing observation method and processing method using the sameKAITO TAKASHI·Filed 2008·Granted Sep 18, 2012·3 cites·19 claims
- 1270US11950821B2Surgical tool for positioning a surgical device, surgical device and kitMEDACTA INT SA·Filed 2019·Granted Apr 9, 2024·2 cites·9 claims
- 1368US6797952B2Scanning atom probeSII NANOTECHNOLOGY INC·Filed 2002·Granted Sep 28, 2004·25 cites·15 claims
- 1465US4950498AProcess for repairing pattern filmSEIKO INSTR INC·Filed 1987·Granted Aug 21, 1990·17 cites·8 claims
- 1562US5376883AAnalysis of integrated circuit operability using a focused ion beamSEIKO INSTR INC·Filed 1992·Granted Dec 27, 1994·23 cites·4 claims
- 1658US7511289B2Working method utilizing irradiation of charged particle beam onto sample through passage in gas blowing nozzleSII NANOTECHNOLOGY INC·Filed 2007·Granted Mar 31, 2009·0 cites·20 claims
- 1757US12186456B2Artificial bone and manufacturing method of artificial boneUNIV OSAKA·Filed 2019·Granted Jan 7, 2025·0 cites·8 claims
- 1855US6544897B2Method for forming a vertical edge submicron through-hole and a thin film sample with this kind of through-holeSEIKO INSTR INC·Filed 2001·Granted Apr 8, 2003·5 cites·10 claims
- 1954US7476418B2Method for fabricating nanometer-scale structureSII NANOTECHNOLOGY INC·Filed 2004·Granted Jan 13, 2009·1 cites·24 claims
- 2053US8728286B2Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the sameKAITO TAKASHI·Filed 2007·Granted May 20, 2014·0 cites·7 claims
- 2149US6740368B2Beam shaped film pattern formation methodSII NANOTECHNOLOGY INC·Filed 2001·Granted May 25, 2004·2 cites·11 claims
- 2247US4874632AProcess for forming pattern filmSEIKO INSTR INC·Filed 1986·Granted Oct 17, 1989·7 cites·33 claims
- 2344US2004209163A1Electrochemical cellFiled 2004·Application pending·0 cites
- 2441US7326445B2Method and apparatus for manufacturing ultra fine three-dimensional structureSII NANOTECHNOLOGY INC·Filed 2001·Granted Feb 5, 2008·5 cites·23 claims
- 2540US4704526AApparatus of regulating shape of focused ion beamsSEIKO INSTR & ELECTRONICS·Filed 1985·Granted Nov 3, 1987·5 cites·19 claims
- 2640US2005066882A1Method for forming ultra-high strength elastic diamond like carbon structureFiled 2002·Application pending·0 cites
- 2739US2004154744A1Method and system for surface or cross-sectional processing and observationFiled 2004·Application pending·0 cites
- 2836US2006192114A1Processing probe, processing apparatus, and method of manufacturing the processing probeADACHI TATSUYA·Filed 2006·Application pending·0 cites
- 2928US5071671AProcess for forming pattern filmsSEIKO INSTR INC·Filed 1989·Granted Dec 10, 1991·1 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →