Inventor · disambiguated record
Takayuki Kihara
Also filed as: KIHARA TAKAYUKI
17 granted patents·7 pending applications·44 citations·filing 1994–2024
89Inventor score
Top patents by PatentIndex Score
24 records- 0177US8765492B2Silicon wafer and method of manufacturing sameONO TOSHIAKI·Filed 2010·Granted Jul 1, 2014·5 cites·8 claims
- 0275US8067820B2Silocon wafer supporting method, heat treatment jig and heat-treated waferKIHARA TAKAYUKI·Filed 2007·Granted Nov 29, 2011·6 cites·2 claims
- 0371US8685855B2Tray for CVD and method for forming film using sameNAKAYAMA TAKASHI·Filed 2010·Granted Apr 1, 2014·1 cites·17 claims
- 0466US8080106B2Epitaxial silicon wafer and production method thereofKIHARA TAKAYUKI·Filed 2009·Granted Dec 20, 2011·2 cites·1 claims
- 0562US7225360B2Automatic analysis apparatus and method for controlling an analysis unitSHIMADZU CORP·Filed 2004·Granted May 29, 2007·4 cites·8 claims
- 0661US2025080522A1Information processing system, information processing method, and programNEC CORP·Filed 2024·Application pending·0 cites
- 0758US5818610AScanner frameB C LABS INC·Filed 1994·Granted Oct 6, 1998·23 cites·19 claims
- 0853US11554458B2Polishing head, wafer polishing apparatus using the same, and wafer polishing method using the sameSUMCO CORP·Filed 2019·Granted Jan 17, 2023·0 cites·16 claims
- 0953US10455239B2Information display processing device and control program for information display processing deviceSHIMADZU CORP·Filed 2014·Granted Oct 22, 2019·0 cites·22 claims
- 1052US2025157839A1Packaging unit and transportation containerSUMCO CORP·Filed 2023·Application pending·0 cites
- 1151US10511501B2Analyzing device system and program for the systemSHIMADZU CORP·Filed 2014·Granted Dec 17, 2019·0 cites·11 claims
- 1251US7226571B2High resistivity silicon wafer and method for fabricating the sameSUMITOMO MITSUBISHI SILICON·Filed 2004·Granted Jun 5, 2007·3 cites·18 claims
- 1350US12285840B2Polishing head, polishing apparatus, and method of manufacturing semiconductor waferSUMCO CORP·Filed 2019·Granted Apr 29, 2025·0 cites·13 claims
- 1450US11959892B2Liquid chromatograph with improved defect eliminationSHIMADZU CORP·Filed 2019·Granted Apr 16, 2024·0 cites·8 claims
- 1550US9739756B2Data processing system and method for chromatographSHIMADZU CORP·Filed 2014·Granted Aug 22, 2017·0 cites·8 claims
- 1649US9190267B2Epitaxial silicon wafer and production method thereofKIHARA TAKAYUKI·Filed 2011·Granted Nov 17, 2015·0 cites·4 claims
- 1749US2008292523A1Silicon single crystal wafer and the production methodSUMCO CORP·Filed 2008·Application pending·0 cites
- 1846US2015046857A1Displaying and executing operation assistance programSHIMADZU CORP·Filed 2014·Application pending·0 cites
- 1945US12120103B2Information processing system, information processing method, and programNEC CORP·Filed 2020·Granted Oct 15, 2024·0 cites·12 claims
- 2043US2013191756A1Analyzing Device Control SystemSHIMADZU CORP·Filed 2013·Application pending·0 cites
- 2142US2009304490A1Method for holding silicon waferKIHARA TAKAYUKI·Filed 2008·Application pending·0 cites
- 2237US6803242B2Evaluation method of IG effectivity in semiconductor silicon substratesSUMITOMO MITSUBISHI SILICON·Filed 2003·Granted Oct 12, 2004·0 cites·2 claims
- 2337US2016350137A1Guide file creation programSHIMADZU CORP·Filed 2016·Application pending·0 cites
- 2431US11274371B2Susceptor and epitaxial growth deviceSUMCO CORP·Filed 2016·Granted Mar 15, 2022·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →