Inventor · disambiguated record
Tadashi Kitamura
Also filed as: KITAMURA TADASHI
26 granted patents·5 pending applications·724 citations·filing 1976–2016
97Inventor score
Files withMITSUI CHEMICALS INC8KITAMURA TADASHI5MITSUI TOATSU CHEMICALS5NANOGEOMETRY RES INC3NGR INC3
Top patents by PatentIndex Score
31 records- 0194US6868175B1Pattern inspection apparatus, pattern inspection method, and recording mediumNANOGEOMETRY RES·Filed 2000·Granted Mar 15, 2005·165 cites·22 claims
- 0294US6555187B1Sealing material composition for liquid crystalMITSUI CHEMICALS INC·Filed 2000·Granted Apr 29, 2003·61 cites·42 claims
- 0393US7796801B2Pattern inspection apparatus and methodNANOGEOMETRY RES INC·Filed 2006·Granted Sep 14, 2010·81 cites·18 claims
- 0491US8045785B2Pattern inspection apparatus and methodNGR INC·Filed 2010·Granted Oct 25, 2011·32 cites·27 claims
- 0591US6812065B1Anisotropic conductive pasteMITSUI CHEMICALS INC·Filed 2000·Granted Nov 2, 2004·46 cites·24 claims
- 0690US8150140B2System and method for a semiconductor lithographic process control using statistical information in defect identificationKITAMURA TADASHI·Filed 2010·Granted Apr 3, 2012·15 cites·17 claims
- 0789US7817844B2Pattern inspection apparatus and methodNANOGEOMETRY RES INC·Filed 2005·Granted Oct 19, 2010·47 cites·32 claims
- 0888US6913798B2Sealing material for plastic liquid crystal display cells including two-component epoxy resin compositionMITSUI CHEMICALS INC·Filed 2001·Granted Jul 5, 2005·34 cites·11 claims
- 0986US7903230B2Method for producing liquid crystal display cell and sealing agent for liquid crystal display cellMITSUI CHEMICALS INC·Filed 2007·Granted Mar 8, 2011·8 cites·2 claims
- 1086US7660455B2Pattern inspection apparatus, pattern inspection method, and recording mediumNANOGEOMETRY RES INC·Filed 2005·Granted Feb 9, 2010·24 cites·22 claims
- 1184US9555516B2Method for processing an edge of a glass plateBROWN JAMES W·Filed 2009·Granted Jan 31, 2017·11 cites·19 claims
- 1283US7541075B2Sealant material for plastic liquid crystal display cells including one component epoxy resin compositionMITSUI CHEMICALS INC·Filed 2005·Granted Jun 2, 2009·4 cites·7 claims
- 1382US8422761B2Defect and critical dimension analysis systems and methods for a semiconductor lithographic processKITAMURA TADASHI·Filed 2009·Granted Apr 16, 2013·12 cites·8 claims
- 1482US8285031B2Pattern inspection apparatus and methodKITAMURA TADASHI·Filed 2011·Granted Oct 9, 2012·11 cites·14 claims
- 1578US6399953B1Scanning electronic microscope and method for automatically observing semiconductor waferSEIKO INSTR INC·Filed 1999·Granted Jun 4, 2002·31 cites·8 claims
- 1678US4122143AProcess for producing cured productsMITSUI TOATSU CHEMICALS·Filed 1976·Granted Oct 24, 1978·38 cites·7 claims
- 1773US7983471B2Pattern inspection apparatus and methodNGR INC·Filed 2007·Granted Jul 19, 2011·8 cites·34 claims
- 1873US4387115AComposition for conductive cured productMITSUI TOATSU CHEMICALS·Filed 1981·Granted Jun 7, 1983·22 cites·23 claims
- 1969US9189843B2Pattern inspection apparatus and methodKITAMURA TADASHI·Filed 2012·Granted Nov 17, 2015·4 cites·2 claims
- 2063US5444245AMethod of automatically setting coordinate conversion factorSEIKO INSTR INC·Filed 1993·Granted Aug 22, 1995·16 cites·3 claims
- 2155US7566377B2Liquid crystal sealing agent composition and manufacturing method of liquid crystal display panel using the sameMITSUI CHEMICALS INC·Filed 2003·Granted Jul 28, 2009·3 cites·26 claims
- 2253US5633317AIsocyanate resin compositions and hot melt and pressure sensitive adhesives based thereonMITSUI TOATSU CHEMICALS·Filed 1994·Granted May 27, 1997·12 cites·16 claims
- 2352US5095059AOiled-face adherable, hot-melt adhesive composition and a non-slip processing method of metal scaffolding boardMITSUI TOATSU CHEMICALS·Filed 1991·Granted Mar 10, 1992·19 cites·11 claims
- 2448US5418288AIsocyanate resin compositions and hot melt and pressure sensitive adhesives based thereonMITSUI TOATSU CHEMICALS·Filed 1993·Granted May 23, 1995·14 cites·55 claims
- 2543US5477049AParticle analysis methodSEIKO INSTR INC·Filed 1994·Granted Dec 19, 1995·6 cites·2 claims
- 2640US9459614B2Machining condition estimating apparatus and machining condition estimating methodHITACHI METALS LTD·Filed 2014·Granted Oct 4, 2016·0 cites·10 claims
- 2740US2012117520A1Systems And Methods For Inspecting And Controlling Integrated Circuit Fabrication Using A Calibrated Lithography SimulatorKITAMURA TADASHI·Filed 2011·Application pending·0 cites
- 2840US2005143513A1Method for producing liquid crystal display cell and sealing agent for liquid crystal display cellMITSUI CHEMICALS INC·Filed 2003·Application pending·0 cites
- 2939US2004081350A1Pattern inspection apparatus and methodFiled 2003·Application pending·0 cites
- 3037US2017372464A1Pattern inspection method and pattern inspection apparatusNGR INC·Filed 2016·Application pending·0 cites
- 3136US2004075802A1Sealant for liquid crystal display cell, composition for liquid crystal display cell sealant and liquid crystal display elementMITSUI CHEMICALS INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →