Inventor · disambiguated record
Takahiro Komeichi
Also filed as: KOMEICHI TAKAHIRO
12 granted patents·1 pending application·26 citations·filing 2010–2022
85Inventor score
Top patents by PatentIndex Score
13 records- 0182US11536841B2Surveying system and surveying methodTOPCON CORP·Filed 2019·Granted Dec 27, 2022·3 cites·3 claims
- 0279US10810699B2Point cloud data processing device, point cloud data processing method, and point cloud data processing programTOPCON CORP·Filed 2018·Granted Oct 20, 2020·3 cites·8 claims
- 0379US8395665B2Automatic tracking method and surveying deviceOTANI HITOSHI·Filed 2010·Granted Mar 12, 2013·11 cites·24 claims
- 0477US10877155B2Survey data processing device, survey data processing method, and survey data processing programTOPCON CORP·Filed 2019·Granted Dec 29, 2020·3 cites·9 claims
- 0576US11004250B2Point cloud data display systemTOPCON CORP·Filed 2019·Granted May 11, 2021·3 cites·7 claims
- 0674US11789151B2Target unitTOPCON CORP·Filed 2022·Granted Oct 17, 2023·0 cites·13 claims
- 0770US10634791B2Laser scanner system and registration method of point cloud dataTOPCON CORP·Filed 2017·Granted Apr 28, 2020·2 cites·5 claims
- 0866US10650583B2Image processing device, image processing method, and image processing programTOPCON CORP·Filed 2018·Granted May 12, 2020·1 cites·3 claims
- 0950US10823563B2Laser scanner systemTOPCON CORP·Filed 2019·Granted Nov 3, 2020·0 cites·18 claims
- 1047US10755671B2Device, method, and program for controlling displaying of survey imageTOPCON CORP·Filed 2018·Granted Aug 25, 2020·0 cites·7 claims
- 1147US10488196B2Laser scanner system and registration method of point cloud dataTOPCON CORP·Filed 2017·Granted Nov 26, 2019·0 cites·9 claims
- 1243US10176615B2Image processing device, image processing method, and image processing programTOPCON CORP·Filed 2016·Granted Jan 8, 2019·0 cites·6 claims
- 1338US2017078570A1Image processing device, image processing method, and image processing programTOPCON CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →