Inventor · disambiguated record
Tatsuya Maeda
Also filed as: MAEDA TATSUYA
46 granted patents·1 pending application·585 citations·filing 1991–2022
98Inventor score
Files withHITACHI HIGH TECH CORP13HITACHI LTD9YAZAKI CORP9MAEDA TATSUYA2MATSUI SHIKISO KAGAKU KOGYOSHO2
Top patents by PatentIndex Score
47 records- 0196US7366620B2Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabricationHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 29, 2008·30 cites·15 claims
- 0292US6627888B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Sep 30, 2003·30 cites·9 claims
- 0391US5598002AElectron beam apparatusHITACHI LTD·Filed 1996·Granted Jan 28, 1997·68 cites·11 claims
- 0490US7807980B2Charged particle beam apparatus and methods for capturing images using the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 5, 2010·11 cites·7 claims
- 0590US7476857B2Tool-to-tool matching control method and its system for scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 13, 2009·10 cites·28 claims
- 0690US5221288AThermochromic dyeing method and cellulose product dyed therebyMATSUI SHIKISO KAGAKU KOGYOSHO·Filed 1991·Granted Jun 22, 1993·61 cites·40 claims
- 0789US8003940B2Tool-to-tool matching control method and its system for scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 23, 2011·9 cites·7 claims
- 0889US7408154B2Scanning electron microscope, method for measuring a dimension of a pattern using the same, and apparatus for correcting difference between scanning electron microscopesHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 5, 2008·12 cites·13 claims
- 0989US5512747AAuto focusing apparatus of scanning electron microscopesHITACHI LTD·Filed 1994·Granted Apr 30, 1996·59 cites·8 claims
- 1087US7545977B2Image processing apparatus for analysis of pattern matching failureHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 9, 2009·10 cites·8 claims
- 1182US9783041B2Dump truck radiatorKOMATSU MFG CO LTD·Filed 2014·Granted Oct 10, 2017·8 cites·9 claims
- 1282US5921125AControl method of terminal crimping deviceYAZAKI CORP·Filed 1997·Granted Jul 13, 1999·26 cites·3 claims
- 1379US8199962B2Loudspeaker diaphragm and loudspeaker using the sameMAEDA TATSUYA·Filed 2008·Granted Jun 12, 2012·10 cites·5 claims
- 1479US7446313B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 4, 2008·4 cites·6 claims
- 1577US7439505B2Scanning electron microscopeHITACHI LTD·Filed 2005·Granted Oct 21, 2008·2 cites·7 claims
- 1675US8872106B2Pattern measuring apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 28, 2014·3 cites·10 claims
- 1774US12215290B2Naphthyl phenyl ether compound and lubricant composition containing sameMORESCO CORP·Filed 2022·Granted Feb 4, 2025·0 cites·3 claims
- 1874US8502144B2Tool-to-tool matching control method and its system for scanning electron microscopeOOSAKI MAYUKA·Filed 2011·Granted Aug 6, 2013·3 cites·9 claims
- 1973US8384030B2Method and apparatus for setting sample observation condition, and method and apparatus for sample observationHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 26, 2013·3 cites·20 claims
- 2073US6738134B2Inspection method and inspection system of a terminal metal fittingYAZAKI CORP·Filed 2001·Granted May 18, 2004·17 cites·8 claims
- 2173US5614713AScanning electron microscopeHITACHI LTD·Filed 1996·Granted Mar 25, 1997·26 cites·10 claims
- 2272US6786751B2Combined terminal fittingSUMITOMO WIRING SYSTEMS·Filed 2003·Granted Sep 7, 2004·20 cites·9 claims
- 2372US6530795B2Unitable terminal fitting, a construction for uniting a plurality of terminal fittings and method for forming a unitable terminal fittingSUMITOMO WIRING SYSTEMS·Filed 2002·Granted Mar 11, 2003·20 cites·12 claims
- 2470US7372047B2Charged particle system and a method for measuring image magnificationHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·2 cites·19 claims
- 2569US8200006B2Image processing apparatus for analysis of pattern matching failureIKEDA MITSUJI·Filed 2009·Granted Jun 12, 2012·6 cites·12 claims
- 2668US8188427B2Scanning electron microscope alignment method and scanning electron microscopeKAKUTA JUNICHI·Filed 2008·Granted May 29, 2012·3 cites·10 claims
- 2768US5252103APigmenting of cellulose textiles: treatment with cationic compound and immersion in aqueous pigment dispersionMATSUI SHIKISO KAGAKU KOGYOSHO·Filed 1992·Granted Oct 12, 1993·19 cites·17 claims
- 2866US5887469ATerminal crimping deviceYAZAKI CORP·Filed 1997·Granted Mar 30, 1999·25 cites·2 claims
- 2965US8207512B2Charged particle beam apparatus and methods for capturing images using the sameSHISHIDO CHIE·Filed 2010·Granted Jun 26, 2012·1 cites·8 claims
- 3065US8124934B2Scanning electron microscopeMAEDA TATSUYA·Filed 2008·Granted Feb 28, 2012·1 cites·12 claims
- 3163US6803573B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Oct 12, 2004·6 cites·6 claims
- 3263US5966806AControl method of terminal crimping deviceYAZAKI CORP·Filed 1997·Granted Oct 19, 1999·24 cites·2 claims
- 3363US5404634AWire ends processing apparatusYAZAKI CORP·Filed 1994·Granted Apr 11, 1995·23 cites·4 claims
- 3461US7409080B2Inspection method of electric partYAZAKI CORP·Filed 2005·Granted Aug 5, 2008·3 cites·2 claims
- 3559US7006681B2Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittingsYAZAKI CORP·Filed 2001·Granted Feb 28, 2006·4 cites·13 claims
- 3658US8666165B2Scanning electron microscopeYAMAGUCHI SATORU·Filed 2008·Granted Mar 4, 2014·1 cites·6 claims
- 3754US7640509B2Program creation apparatus, program creation method and programNEC ELECTRONICS CORP·Filed 2006·Granted Dec 29, 2009·1 cites·13 claims
- 3852US7002151B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted Feb 21, 2006·2 cites·12 claims
- 3951US2021296955A1Electric work machineMAKITA CORP·Filed 2021·Application pending·0 cites
- 4049US12399013B2Power generation planning device and power generation planning methodHITACHI LTD·Filed 2021·Granted Aug 26, 2025·0 cites·10 claims
- 4147US12191663B2Power supply and demand planning deviceHITACHI LTD·Filed 2020·Granted Jan 7, 2025·0 cites·9 claims
- 4247US7684937B2Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabricationHITACHI HIGH TECH CORP·Filed 2008·Granted Mar 23, 2010·0 cites·9 claims
- 4346US9000366B2Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patternsHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 7, 2015·0 cites·10 claims
- 4445US7433542B2Method for measuring line and space pattern using scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 7, 2008·2 cites·11 claims
- 4545US5901440AControl method of terminal crimping deviceYAZAKI CORP·Filed 1997·Granted May 11, 1999·11 cites·3 claims
- 4631US6115800AMethod for managing received radio dataNEC CORP·Filed 1997·Granted Sep 5, 2000·2 cites·6 claims
- 4731US5570191AIdentification of connector terminalsYAZAKI CORP·Filed 1994·Granted Oct 29, 1996·7 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →