Inventor · disambiguated record
Takahito Matsuzawa
Also filed as: MATSUZAWA TAKAHITO
1 granted patent·4 pending applications·5 citations·filing 2006–2023
26Inventor score
Files withTOKYO ELECTRON LTD5
Top patents by PatentIndex Score
5 records- 0160US7777510B2Wafer inspecting apparatus, wafer inspecting method and computer programTOKYO ELECTRON LTD·Filed 2006·Granted Aug 17, 2010·5 cites·15 claims
- 0251US2023395411A1Data collection system, data collection apparatus, data collection method, and data collection programTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0348US2024045388A1Management apparatus, prediction method, and prediction programTOKYO ELECTRON LTD·Filed 2021·Application pending·0 cites
- 0443US2024045401A1Management system, management method, and management programTOKYO ELECTRON LTD·Filed 2021·Application pending·0 cites
- 0528US2009037699A1Apparatus and method for processing semiconductorTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →