Inventor · disambiguated record
Takahiro Mizuno
Also filed as: MIZUNO TAKAHIRO
14 granted patents·5 pending applications·112 citations·filing 1992–2025
89Inventor score
Top patents by PatentIndex Score
19 records- 0177US5266598ASkin disinfectant compositionsMARUISHI PHARMA·Filed 1992·Granted Nov 30, 1993·54 cites·6 claims
- 0272US8245813B2Steering apparatusMIZUNO TAKAHIRO·Filed 2010·Granted Aug 21, 2012·6 cites·7 claims
- 0372US7841443B2Steering apparatusJTEKT CORP·Filed 2007·Granted Nov 30, 2010·8 cites·10 claims
- 0471US10508222B2Polishing composition and polishing method using sameFUJIMI INC·Filed 2018·Granted Dec 17, 2019·1 cites·9 claims
- 0566US6154927AHingeTOGO SEISAKUSHO KK·Filed 1998·Granted Dec 5, 2000·34 cites·10 claims
- 0664US10263527B1Power converterMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Apr 16, 2019·1 cites·2 claims
- 0761US6590341B1Discharge lamp with foil-stiffening creaseUSHIO ELECTRIC INC·Filed 2000·Granted Jul 8, 2003·6 cites·4 claims
- 0859US2025282219A1Display control device, display control method, and computer-readable storage mediumTOYOTA MOTOR CO LTD·Filed 2025·Application pending·0 cites
- 0958US11495943B2Bus bar protectorYAZAKI CORP·Filed 2020·Granted Nov 8, 2022·0 cites·7 claims
- 1054US11056730B2Voltage detection terminal holding structureYAZAKI CORP·Filed 2019·Granted Jul 6, 2021·0 cites·5 claims
- 1154US2009038774A1Air conditioner for vehicleDENSO CORP·Filed 2008·Application pending·0 cites
- 1253US7053016B2Ceramic porous body and method of manufacturing glass usable as binder thereforNGK INSULATORS LTD·Filed 2002·Granted May 30, 2006·2 cites·3 claims
- 1345US10144849B2Polishing composition and polishing method using the sameMIZUNO TAKAHIRO·Filed 2009·Granted Dec 4, 2018·0 cites·14 claims
- 1443US8425285B2Duct installation structureKAMIGASHIMA HAYATO·Filed 2008·Granted Apr 23, 2013·0 cites·4 claims
- 1542US2013146804A1Polishing composition and polishing method using sameMIZUNO TAKAHIRO·Filed 2011·Application pending·0 cites
- 1640US12287355B2Semiconductor testing device, semiconductor testing method, and manufacturing method for semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2021·Granted Apr 29, 2025·0 cites·17 claims
- 1730US2021118310A1Training Data Generation Method, Training Data Generation Apparatus, And Training Data Generation ProgramNIHON ONKYO ENGENEERING CO LTD·Filed 2018·Application pending·0 cites
- 1829US11450217B2Device for collecting aircraft operation history informationNIHON ONKYO ENG CO LTD·Filed 2017·Granted Sep 20, 2022·0 cites·10 claims
- 1928US2023224655A1Failure Diagnosing Method, Noise Measuring Device, And Failure Diagnosing SystemNIHON ONKYO ENG CO LTD·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →