Inventor · disambiguated record
Takeshi Murakami
Also filed as: HAZAMA KATASHI · MURAKAMI TAKESHI · NODA MASARU
208 granted patents·31 pending applications·4,870 citations·filing 1977–2024
99Inventor score
Top patents by PatentIndex Score
239 records- 0199US7420164B2Objective lens, electron beam system and method of inspecting defectEBARA CORP·Filed 2005·Granted Sep 2, 2008·68 cites·1 claims
- 0298US11256187B2Process cartridge and electrophotographic apparatusCANON KK·Filed 2020·Granted Feb 22, 2022·12 cites·10 claims
- 0398US9535347B2Electrophotographic photosensitive member, process cartridge and electrophotographic apparatusCANON KK·Filed 2014·Granted Jan 3, 2017·23 cites·10 claims
- 0498US9368314B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2014·Granted Jun 14, 2016·38 cites·10 claims
- 0598US9068083B2Method of producing gallium phthalocyanine crystal and method of producing electrophotographic photosensitive member using the method of producing gallium phthalocyanine crystalCANON KK·Filed 2012·Granted Jun 30, 2015·28 cites·12 claims
- 0698US8974991B2Electrophotographic photosensitive member, method of producing phthalocyanine crystal, method of producing electrophotographic photosensitive member, process cartridge, electrophotographic apparatus, and phthalocyanine crystalCANON KK·Filed 2012·Granted Mar 10, 2015·31 cites·5 claims
- 0798US8841052B2Electrophotographic photosensitive member, process cartridge and electrophotographic apparatusCANON KK·Filed 2012·Granted Sep 23, 2014·32 cites·9 claims
- 0898US7138629B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2004·Granted Nov 21, 2006·151 cites·22 claims
- 0998US6992290B2Electron beam inspection system and inspection method and method of manufacturing devices using the systemTOSHIBA KK·Filed 2001·Granted Jan 31, 2006·97 cites·5 claims
- 1098US6593152B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2001·Granted Jul 15, 2003·109 cites·60 claims
- 1198US5728223AReactant gas ejector head and thin-film vapor deposition apparatusEBARA CORP·Filed 1996·Granted Mar 17, 1998·674 cites·28 claims
- 1297US11392074B2Electrophotographic photosensitive member having outer surface with first and second structure groups, the first structure group having a smaller appearance period and a lower height than the second structure groupCANON KK·Filed 2021·Granted Jul 19, 2022·7 cites·7 claims
- 1397US9459542B2Electrophotographic photosensitive member, process cartridge, electrophotographic apparatus, and gallium phthalocyanine crystalCANON KK·Filed 2012·Granted Oct 4, 2016·24 cites·9 claims
- 1497US9436107B2Method of producing electrophotographic photosensitive member, and emulsion for a charge transporting layerCANON KK·Filed 2013·Granted Sep 6, 2016·29 cites·13 claims
- 1597US9280071B2Method of producing electrophotographic photosensitive member, and emulsion for a charge transporting layerCANON KK·Filed 2013·Granted Mar 8, 2016·30 cites·11 claims
- 1697US8497476B2Inspection deviceHATAKEYAMA MASAHIRO·Filed 2012·Granted Jul 30, 2013·42 cites·10 claims
- 1797US7947383B2Organic electroluminescent deviceFUJIFILM CORP·Filed 2005·Granted May 24, 2011·104 cites·11 claims
- 1897US7741601B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2008·Granted Jun 22, 2010·36 cites·13 claims
- 1997US7365324B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2006·Granted Apr 29, 2008·49 cites·7 claims
- 2097US7351969B2Electron beam inspection system and inspection method and method of manufacturing devices using the systemEBARA CORP·Filed 2005·Granted Apr 1, 2008·37 cites·5 claims
- 2197US7223973B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerEBARA CORP·Filed 2005·Granted May 29, 2007·38 cites·10 claims
- 2297US6855929B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerEBARA CORP·Filed 2001·Granted Feb 15, 2005·106 cites·55 claims
- 2397US6282368B1Liquid feed vaporization system and gas injection deviceEBARA CORP·Filed 2000·Granted Aug 28, 2001·104 cites·5 claims
- 2497US6176929B1Thin-film deposition apparatusEBARA CORP·Filed 1998·Granted Jan 23, 2001·340 cites·32 claims
- 2597US5951923AVaporizer apparatus and film deposition apparatus therewithEBARA CORP·Filed 1997·Granted Sep 14, 1999·275 cites·45 claims
- 2696US7569838B2Electron beam inspection system and inspection method and method of manufacturing devices using the systemEBARA CORP·Filed 2008·Granted Aug 4, 2009·23 cites·5 claims
- 2796US7385197B2Electron beam apparatus and a device manufacturing method using the same apparatusEBARA CORP·Filed 2005·Granted Jun 10, 2008·30 cites·5 claims
- 2896US6132512AVapor-phase film growth apparatus and gas ejection headEBARA CORP·Filed 1998·Granted Oct 17, 2000·225 cites·9 claims
- 2996US5417618AToothed beltMITSUBOSHI BELTING LTD·Filed 1994·Granted May 23, 1995·80 cites·24 claims
- 3095US9772569B2Electrophotographic photosensitive member, process cartridge, and electrophotographic apparatusCANON KK·Filed 2016·Granted Sep 26, 2017·9 cites·11 claims
- 3195US8822919B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerKIMBA TOSHIFUMI·Filed 2011·Granted Sep 2, 2014·15 cites·10 claims
- 3295US7736755B2Organic electroluminescent deviceFUJIFILM CORP·Filed 2006·Granted Jun 15, 2010·58 cites·9 claims
- 3395US7411191B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2007·Granted Aug 12, 2008·20 cites·4 claims
- 3495US4773895ADouble ribbed beltMITSUBOSHI BELTING LTD·Filed 1987·Granted Sep 27, 1988·61 cites·18 claims
- 3594US8946631B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2014·Granted Feb 3, 2015·11 cites·14 claims
- 3694US7745017B2Organic electroluminescent device and method for producing the sameFUJIFILM CORP·Filed 2005·Granted Jun 29, 2010·37 cites·8 claims
- 3794US7312449B2Electron beam system and method of manufacturing devices using the systemEBARA CORP·Filed 2005·Granted Dec 25, 2007·20 cites·9 claims
- 3894US7256405B2Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same methodEBARA CORP·Filed 2005·Granted Aug 14, 2007·21 cites·17 claims
- 3994US7241993B2Inspection system by charged particle beam and method of manufacturing devices using the systemTOSHIBA KK·Filed 2001·Granted Jul 10, 2007·54 cites·12 claims
- 4093US9658543B2Method for producing electrophotographic photosensitive memberCANON KK·Filed 2015·Granted May 23, 2017·6 cites·5 claims
- 4193US9405206B2Electrophotographic photosensitive member and method of producing the electrophotographic photosensitive member, and process cartridge and electrophotographic apparatus each including the electrophotographic photosensitive memberCANON KK·Filed 2014·Granted Aug 2, 2016·8 cites·10 claims
- 4293US7928378B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerEBARA CORP·Filed 2008·Granted Apr 19, 2011·17 cites·11 claims
- 4393US7592798B2Magnetic encoder and bearingNSK LTD·Filed 2005·Granted Sep 22, 2009·33 cites·24 claims
- 4493US7425703B2Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation methodEBARA CORP·Filed 2005·Granted Sep 16, 2008·16 cites·3 claims
- 4593US7408175B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerEBARA CORP·Filed 2007·Granted Aug 5, 2008·19 cites·9 claims
- 4693US7005641B2Electron beam apparatus and a device manufacturing method by using said electron beam apparatusEBARA CORP·Filed 2003·Granted Feb 28, 2006·35 cites·9 claims
- 4792USD838917SHelmetOGK KABUTO CO LTD·Filed 2017·Granted Jan 22, 2019·38 cites·1 claims
- 4892US10095137B2Electrophotographic photosensitive member, method of producing electrophotographic photosensitive member, process cartridge, and electrophotographic image forming apparatusCANON KK·Filed 2017·Granted Oct 9, 2018·5 cites·14 claims
- 4992US10018928B2Electrophotographic photosensitive member, method of producing electrophotographic photosensitive member, and process cartridge and electrophotographic apparatus each including the electrophotographic photosensitive memberCANON KK·Filed 2017·Granted Jul 10, 2018·5 cites·19 claims
- 5091US11782353B2Method for producing electrophotographic photosensitive memberCANON KK·Filed 2021·Granted Oct 10, 2023·2 cites·8 claims
Showing the top 50 of 239 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →